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Research Progress of Palladium-Plated Copper Bonding Wire in Microelectronic Packaging

Wire-bonding technology is the most commonly used chip interconnection technology in microelectronic packaging. Metal bonding wire is the key material for wire bonding and plays an important role in the reliability of electronic devices. In recent years, palladium-plated copper (PdCu) bonding wire h...

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Autores principales: Zhang, Yuemin, Guo, Haiyun, Cao, Jun, Wu, Xuefeng, Jia, Hewei, Chang, Andong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10456959/
https://www.ncbi.nlm.nih.gov/pubmed/37630074
http://dx.doi.org/10.3390/mi14081538
_version_ 1785096824657281024
author Zhang, Yuemin
Guo, Haiyun
Cao, Jun
Wu, Xuefeng
Jia, Hewei
Chang, Andong
author_facet Zhang, Yuemin
Guo, Haiyun
Cao, Jun
Wu, Xuefeng
Jia, Hewei
Chang, Andong
author_sort Zhang, Yuemin
collection PubMed
description Wire-bonding technology is the most commonly used chip interconnection technology in microelectronic packaging. Metal bonding wire is the key material for wire bonding and plays an important role in the reliability of electronic devices. In recent years, palladium-plated copper (PdCu) bonding wire has been widely used because of its low cost, good electrical and thermal conductivity, the fact that it is not easy to oxidize, and its high reliability. Therefore, it is necessary to review its research progress. In this paper, the preparation and application of palladium-plated copper bonding wire are reviewed. Firstly, the preparation methods of electroplating, electroless plating, and direct plating are introduced. Secondly, the factors affecting the distribution of Pd in free air balls and bonding interfaces, the effect of Pd on the formation and growth of intermetallic compounds in PdCu wire, stitch bond, and reliability of PdCu wire are summarized and analyzed in the application process. Finally, its development prospect is prospected. Hopefully, this review can help readers to have a comprehensive understanding of the preparation and application of palladium-plated copper bonding wires, and can accelerate the promotion of its application in more fields in the future.
format Online
Article
Text
id pubmed-10456959
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-104569592023-08-26 Research Progress of Palladium-Plated Copper Bonding Wire in Microelectronic Packaging Zhang, Yuemin Guo, Haiyun Cao, Jun Wu, Xuefeng Jia, Hewei Chang, Andong Micromachines (Basel) Review Wire-bonding technology is the most commonly used chip interconnection technology in microelectronic packaging. Metal bonding wire is the key material for wire bonding and plays an important role in the reliability of electronic devices. In recent years, palladium-plated copper (PdCu) bonding wire has been widely used because of its low cost, good electrical and thermal conductivity, the fact that it is not easy to oxidize, and its high reliability. Therefore, it is necessary to review its research progress. In this paper, the preparation and application of palladium-plated copper bonding wire are reviewed. Firstly, the preparation methods of electroplating, electroless plating, and direct plating are introduced. Secondly, the factors affecting the distribution of Pd in free air balls and bonding interfaces, the effect of Pd on the formation and growth of intermetallic compounds in PdCu wire, stitch bond, and reliability of PdCu wire are summarized and analyzed in the application process. Finally, its development prospect is prospected. Hopefully, this review can help readers to have a comprehensive understanding of the preparation and application of palladium-plated copper bonding wires, and can accelerate the promotion of its application in more fields in the future. MDPI 2023-07-31 /pmc/articles/PMC10456959/ /pubmed/37630074 http://dx.doi.org/10.3390/mi14081538 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Review
Zhang, Yuemin
Guo, Haiyun
Cao, Jun
Wu, Xuefeng
Jia, Hewei
Chang, Andong
Research Progress of Palladium-Plated Copper Bonding Wire in Microelectronic Packaging
title Research Progress of Palladium-Plated Copper Bonding Wire in Microelectronic Packaging
title_full Research Progress of Palladium-Plated Copper Bonding Wire in Microelectronic Packaging
title_fullStr Research Progress of Palladium-Plated Copper Bonding Wire in Microelectronic Packaging
title_full_unstemmed Research Progress of Palladium-Plated Copper Bonding Wire in Microelectronic Packaging
title_short Research Progress of Palladium-Plated Copper Bonding Wire in Microelectronic Packaging
title_sort research progress of palladium-plated copper bonding wire in microelectronic packaging
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10456959/
https://www.ncbi.nlm.nih.gov/pubmed/37630074
http://dx.doi.org/10.3390/mi14081538
work_keys_str_mv AT zhangyuemin researchprogressofpalladiumplatedcopperbondingwireinmicroelectronicpackaging
AT guohaiyun researchprogressofpalladiumplatedcopperbondingwireinmicroelectronicpackaging
AT caojun researchprogressofpalladiumplatedcopperbondingwireinmicroelectronicpackaging
AT wuxuefeng researchprogressofpalladiumplatedcopperbondingwireinmicroelectronicpackaging
AT jiahewei researchprogressofpalladiumplatedcopperbondingwireinmicroelectronicpackaging
AT changandong researchprogressofpalladiumplatedcopperbondingwireinmicroelectronicpackaging