Electron counting detectors in scanning transmission electron microscopy via hardware signal processing

Transmission electron microscopy is a pivotal instrument in materials and biological sciences due to its ability to provide local structural and spectroscopic information on a wide range of materials. However, the electron detectors used in scanning transmission electron microscopy are often unable...

Descripción completa

Detalles Bibliográficos
Autores principales: Peters, Jonathan J. P., Mullarkey, Tiarnan, Hedley, Emma, Müller, Karin H., Porter, Alexandra, Mostaed, Ali, Jones, Lewys
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10457289/
https://www.ncbi.nlm.nih.gov/pubmed/37626044
http://dx.doi.org/10.1038/s41467-023-40875-w
_version_ 1785096888575328256
author Peters, Jonathan J. P.
Mullarkey, Tiarnan
Hedley, Emma
Müller, Karin H.
Porter, Alexandra
Mostaed, Ali
Jones, Lewys
author_facet Peters, Jonathan J. P.
Mullarkey, Tiarnan
Hedley, Emma
Müller, Karin H.
Porter, Alexandra
Mostaed, Ali
Jones, Lewys
author_sort Peters, Jonathan J. P.
collection PubMed
description Transmission electron microscopy is a pivotal instrument in materials and biological sciences due to its ability to provide local structural and spectroscopic information on a wide range of materials. However, the electron detectors used in scanning transmission electron microscopy are often unable to provide quantified information, that is the number of electrons impacting the detector, without exhaustive calibration and processing. This results in arbitrary signal values with slow response times that cannot be used for quantification or comparison to simulations. Here we demonstrate and optimise a hardware signal processing approach to augment electron detectors to perform single electron counting.
format Online
Article
Text
id pubmed-10457289
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher Nature Publishing Group UK
record_format MEDLINE/PubMed
spelling pubmed-104572892023-08-27 Electron counting detectors in scanning transmission electron microscopy via hardware signal processing Peters, Jonathan J. P. Mullarkey, Tiarnan Hedley, Emma Müller, Karin H. Porter, Alexandra Mostaed, Ali Jones, Lewys Nat Commun Article Transmission electron microscopy is a pivotal instrument in materials and biological sciences due to its ability to provide local structural and spectroscopic information on a wide range of materials. However, the electron detectors used in scanning transmission electron microscopy are often unable to provide quantified information, that is the number of electrons impacting the detector, without exhaustive calibration and processing. This results in arbitrary signal values with slow response times that cannot be used for quantification or comparison to simulations. Here we demonstrate and optimise a hardware signal processing approach to augment electron detectors to perform single electron counting. Nature Publishing Group UK 2023-08-25 /pmc/articles/PMC10457289/ /pubmed/37626044 http://dx.doi.org/10.1038/s41467-023-40875-w Text en © The Author(s) 2023 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Peters, Jonathan J. P.
Mullarkey, Tiarnan
Hedley, Emma
Müller, Karin H.
Porter, Alexandra
Mostaed, Ali
Jones, Lewys
Electron counting detectors in scanning transmission electron microscopy via hardware signal processing
title Electron counting detectors in scanning transmission electron microscopy via hardware signal processing
title_full Electron counting detectors in scanning transmission electron microscopy via hardware signal processing
title_fullStr Electron counting detectors in scanning transmission electron microscopy via hardware signal processing
title_full_unstemmed Electron counting detectors in scanning transmission electron microscopy via hardware signal processing
title_short Electron counting detectors in scanning transmission electron microscopy via hardware signal processing
title_sort electron counting detectors in scanning transmission electron microscopy via hardware signal processing
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10457289/
https://www.ncbi.nlm.nih.gov/pubmed/37626044
http://dx.doi.org/10.1038/s41467-023-40875-w
work_keys_str_mv AT petersjonathanjp electroncountingdetectorsinscanningtransmissionelectronmicroscopyviahardwaresignalprocessing
AT mullarkeytiarnan electroncountingdetectorsinscanningtransmissionelectronmicroscopyviahardwaresignalprocessing
AT hedleyemma electroncountingdetectorsinscanningtransmissionelectronmicroscopyviahardwaresignalprocessing
AT mullerkarinh electroncountingdetectorsinscanningtransmissionelectronmicroscopyviahardwaresignalprocessing
AT porteralexandra electroncountingdetectorsinscanningtransmissionelectronmicroscopyviahardwaresignalprocessing
AT mostaedali electroncountingdetectorsinscanningtransmissionelectronmicroscopyviahardwaresignalprocessing
AT joneslewys electroncountingdetectorsinscanningtransmissionelectronmicroscopyviahardwaresignalprocessing

Ejemplares similares