Cargando…
Lightweight Network DCR-YOLO for Surface Defect Detection on Printed Circuit Boards
To resolve the problems associated with the small target presented by printed circuit board surface defects and the low detection accuracy of these defects, the printed circuit board surface-defect detection network DCR-YOLO is designed to meet the premise of real-time detection speed and effectivel...
Autores principales: | , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10490101/ https://www.ncbi.nlm.nih.gov/pubmed/37687766 http://dx.doi.org/10.3390/s23177310 |
_version_ | 1785103763805044736 |
---|---|
author | Jiang, Yuanyuan Cai, Mengnan Zhang, Dong |
author_facet | Jiang, Yuanyuan Cai, Mengnan Zhang, Dong |
author_sort | Jiang, Yuanyuan |
collection | PubMed |
description | To resolve the problems associated with the small target presented by printed circuit board surface defects and the low detection accuracy of these defects, the printed circuit board surface-defect detection network DCR-YOLO is designed to meet the premise of real-time detection speed and effectively improve the detection accuracy. Firstly, the backbone feature extraction network DCR-backbone, which consists of two CR residual blocks and one common residual block, is used for small-target defect extraction on printed circuit boards. Secondly, the SDDT-FPN feature fusion module is responsible for the fusion of high-level features to low-level features while enhancing feature fusion for the feature fusion layer, where the small-target prediction head YOLO Head-P3 is located, to further enhance the low-level feature representation. The PCR module enhances the feature fusion mechanism between the backbone feature extraction network and the SDDT-FPN feature fusion module at different scales of feature layers. The C(5)ECA module is responsible for adaptive adjustment of feature weights and adaptive attention to the requirements of small-target defect information, further enhancing the adaptive feature extraction capability of the feature fusion module. Finally, three YOLO-Heads are responsible for predicting small-target defects for different scales. Experiments show that the DCR-YOLO network model detection map reaches 98.58%; the model size is 7.73 MB, which meets the lightweight requirement; and the detection speed reaches 103.15 fps, which meets the application requirements for real-time detection of small-target defects. |
format | Online Article Text |
id | pubmed-10490101 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-104901012023-09-09 Lightweight Network DCR-YOLO for Surface Defect Detection on Printed Circuit Boards Jiang, Yuanyuan Cai, Mengnan Zhang, Dong Sensors (Basel) Article To resolve the problems associated with the small target presented by printed circuit board surface defects and the low detection accuracy of these defects, the printed circuit board surface-defect detection network DCR-YOLO is designed to meet the premise of real-time detection speed and effectively improve the detection accuracy. Firstly, the backbone feature extraction network DCR-backbone, which consists of two CR residual blocks and one common residual block, is used for small-target defect extraction on printed circuit boards. Secondly, the SDDT-FPN feature fusion module is responsible for the fusion of high-level features to low-level features while enhancing feature fusion for the feature fusion layer, where the small-target prediction head YOLO Head-P3 is located, to further enhance the low-level feature representation. The PCR module enhances the feature fusion mechanism between the backbone feature extraction network and the SDDT-FPN feature fusion module at different scales of feature layers. The C(5)ECA module is responsible for adaptive adjustment of feature weights and adaptive attention to the requirements of small-target defect information, further enhancing the adaptive feature extraction capability of the feature fusion module. Finally, three YOLO-Heads are responsible for predicting small-target defects for different scales. Experiments show that the DCR-YOLO network model detection map reaches 98.58%; the model size is 7.73 MB, which meets the lightweight requirement; and the detection speed reaches 103.15 fps, which meets the application requirements for real-time detection of small-target defects. MDPI 2023-08-22 /pmc/articles/PMC10490101/ /pubmed/37687766 http://dx.doi.org/10.3390/s23177310 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Jiang, Yuanyuan Cai, Mengnan Zhang, Dong Lightweight Network DCR-YOLO for Surface Defect Detection on Printed Circuit Boards |
title | Lightweight Network DCR-YOLO for Surface Defect Detection on Printed Circuit Boards |
title_full | Lightweight Network DCR-YOLO for Surface Defect Detection on Printed Circuit Boards |
title_fullStr | Lightweight Network DCR-YOLO for Surface Defect Detection on Printed Circuit Boards |
title_full_unstemmed | Lightweight Network DCR-YOLO for Surface Defect Detection on Printed Circuit Boards |
title_short | Lightweight Network DCR-YOLO for Surface Defect Detection on Printed Circuit Boards |
title_sort | lightweight network dcr-yolo for surface defect detection on printed circuit boards |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10490101/ https://www.ncbi.nlm.nih.gov/pubmed/37687766 http://dx.doi.org/10.3390/s23177310 |
work_keys_str_mv | AT jiangyuanyuan lightweightnetworkdcryoloforsurfacedefectdetectiononprintedcircuitboards AT caimengnan lightweightnetworkdcryoloforsurfacedefectdetectiononprintedcircuitboards AT zhangdong lightweightnetworkdcryoloforsurfacedefectdetectiononprintedcircuitboards |