Deciphering genetic basis of developmental and agronomic traits by integrating high‐throughput optical phenotyping and genome‐wide association studies in wheat

Dissecting the genetic basis of complex traits such as dynamic growth and yield potential is a major challenge in crops. Monitoring the growth throughout growing season in a large wheat population to uncover the temporal genetic controls for plant growth and yield‐related traits has so far not been...

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Detalles Bibliográficos
Autores principales: Gao, Jie, Hu, Xin, Gao, Chunyan, Chen, Guang, Feng, Hui, Jia, Zhen, Zhao, Peimin, Yu, Haiyang, Li, Huaiwen, Geng, Zedong, Fu, Jingbo, Zhang, Jun, Cheng, Yikeng, Yang, Bo, Pang, Zhanghan, Xiang, Daoquan, Jia, Jizeng, Su, Handong, Mao, Hailiang, Lan, Caixia, Chen, Wei, Yan, Wenhao, Gao, Lifeng, Yang, Wanneng, Li, Qiang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2023
Materias:
Research Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10502759/
https://www.ncbi.nlm.nih.gov/pubmed/37392004
http://dx.doi.org/10.1111/pbi.14104

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