Cargando…

Kinetics and Modeling of Counter-Current Leaching of Waste Random-Access Memory Chips in a Cu-NH(3)-SO(4) System Utilizing Cu(II) as an Oxidizer

The leaching of Cu in ammoniacal solutions has proven an efficient method to recover Cu from waste printed circuit boards (WPCBs) that has used by many researchers over the last two decades. This study investigates the feasibility of a counter-current leaching circuit that would be coupled with an e...

Descripción completa

Detalles Bibliográficos
Autores principales: Lin, Peijia, Werner, Joshua, Ali, Zulqarnain Ahmad, Bertucci, Lucas, Groppo, Jack
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10532812/
https://www.ncbi.nlm.nih.gov/pubmed/37763552
http://dx.doi.org/10.3390/ma16186274
_version_ 1785112049310760960
author Lin, Peijia
Werner, Joshua
Ali, Zulqarnain Ahmad
Bertucci, Lucas
Groppo, Jack
author_facet Lin, Peijia
Werner, Joshua
Ali, Zulqarnain Ahmad
Bertucci, Lucas
Groppo, Jack
author_sort Lin, Peijia
collection PubMed
description The leaching of Cu in ammoniacal solutions has proven an efficient method to recover Cu from waste printed circuit boards (WPCBs) that has used by many researchers over the last two decades. This study investigates the feasibility of a counter-current leaching circuit that would be coupled with an electrowinning (EW) cell. To accomplish this objective, the paper is divided into three parts. In Part 1, a leaching kinetic framework is developed from a set of experiments that were designed and conducted using end-of-life waste RAM chips as feed sources and Cu(II)-ammoniacal solution as the lixiviant. Various processing parameters, such as particle size, stirring rates, initial Cu(II) concentrations, and temperatures, were evaluated for their effects on the Cu recovery and the leaching rate. It was found that the particle size and initial Cu(II) concentration were the two most important factors in Cu leaching. Using a 1.2 mm particle size diameter and 40 g/L of initial Cu(II) concentration, a maximum Cu recovery of 96% was achieved. The Zhuravlev changing-concentration model was selected to develop the empirically fitted kinetic coefficients. In Part 2, kinetic data were adapted into a leaching function suitable for continuously stirred tank reactors. This was achieved via using the coefficients from the Zhuravlev model and adapting them to the Jander constant concentration model for use in the counter-current circuit model. Part 3 details the development of a counter-current circuit model based on the relevant kinetic model, and the circuit performance was modeled to provide a tool that would allow the exploration of maximum copper recovery whilst minimizing the Cu(II) reporting to electrowinning. A 4-stage counter-current circuit was modeled incorporating a feed of 35 g/L of Cu(II), achieving a 4.12 g/L Cu(II) output with 93% copper recovery.
format Online
Article
Text
id pubmed-10532812
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-105328122023-09-28 Kinetics and Modeling of Counter-Current Leaching of Waste Random-Access Memory Chips in a Cu-NH(3)-SO(4) System Utilizing Cu(II) as an Oxidizer Lin, Peijia Werner, Joshua Ali, Zulqarnain Ahmad Bertucci, Lucas Groppo, Jack Materials (Basel) Article The leaching of Cu in ammoniacal solutions has proven an efficient method to recover Cu from waste printed circuit boards (WPCBs) that has used by many researchers over the last two decades. This study investigates the feasibility of a counter-current leaching circuit that would be coupled with an electrowinning (EW) cell. To accomplish this objective, the paper is divided into three parts. In Part 1, a leaching kinetic framework is developed from a set of experiments that were designed and conducted using end-of-life waste RAM chips as feed sources and Cu(II)-ammoniacal solution as the lixiviant. Various processing parameters, such as particle size, stirring rates, initial Cu(II) concentrations, and temperatures, were evaluated for their effects on the Cu recovery and the leaching rate. It was found that the particle size and initial Cu(II) concentration were the two most important factors in Cu leaching. Using a 1.2 mm particle size diameter and 40 g/L of initial Cu(II) concentration, a maximum Cu recovery of 96% was achieved. The Zhuravlev changing-concentration model was selected to develop the empirically fitted kinetic coefficients. In Part 2, kinetic data were adapted into a leaching function suitable for continuously stirred tank reactors. This was achieved via using the coefficients from the Zhuravlev model and adapting them to the Jander constant concentration model for use in the counter-current circuit model. Part 3 details the development of a counter-current circuit model based on the relevant kinetic model, and the circuit performance was modeled to provide a tool that would allow the exploration of maximum copper recovery whilst minimizing the Cu(II) reporting to electrowinning. A 4-stage counter-current circuit was modeled incorporating a feed of 35 g/L of Cu(II), achieving a 4.12 g/L Cu(II) output with 93% copper recovery. MDPI 2023-09-19 /pmc/articles/PMC10532812/ /pubmed/37763552 http://dx.doi.org/10.3390/ma16186274 Text en © 2023 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Lin, Peijia
Werner, Joshua
Ali, Zulqarnain Ahmad
Bertucci, Lucas
Groppo, Jack
Kinetics and Modeling of Counter-Current Leaching of Waste Random-Access Memory Chips in a Cu-NH(3)-SO(4) System Utilizing Cu(II) as an Oxidizer
title Kinetics and Modeling of Counter-Current Leaching of Waste Random-Access Memory Chips in a Cu-NH(3)-SO(4) System Utilizing Cu(II) as an Oxidizer
title_full Kinetics and Modeling of Counter-Current Leaching of Waste Random-Access Memory Chips in a Cu-NH(3)-SO(4) System Utilizing Cu(II) as an Oxidizer
title_fullStr Kinetics and Modeling of Counter-Current Leaching of Waste Random-Access Memory Chips in a Cu-NH(3)-SO(4) System Utilizing Cu(II) as an Oxidizer
title_full_unstemmed Kinetics and Modeling of Counter-Current Leaching of Waste Random-Access Memory Chips in a Cu-NH(3)-SO(4) System Utilizing Cu(II) as an Oxidizer
title_short Kinetics and Modeling of Counter-Current Leaching of Waste Random-Access Memory Chips in a Cu-NH(3)-SO(4) System Utilizing Cu(II) as an Oxidizer
title_sort kinetics and modeling of counter-current leaching of waste random-access memory chips in a cu-nh(3)-so(4) system utilizing cu(ii) as an oxidizer
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10532812/
https://www.ncbi.nlm.nih.gov/pubmed/37763552
http://dx.doi.org/10.3390/ma16186274
work_keys_str_mv AT linpeijia kineticsandmodelingofcountercurrentleachingofwasterandomaccessmemorychipsinacunh3so4systemutilizingcuiiasanoxidizer
AT wernerjoshua kineticsandmodelingofcountercurrentleachingofwasterandomaccessmemorychipsinacunh3so4systemutilizingcuiiasanoxidizer
AT alizulqarnainahmad kineticsandmodelingofcountercurrentleachingofwasterandomaccessmemorychipsinacunh3so4systemutilizingcuiiasanoxidizer
AT bertuccilucas kineticsandmodelingofcountercurrentleachingofwasterandomaccessmemorychipsinacunh3so4systemutilizingcuiiasanoxidizer
AT groppojack kineticsandmodelingofcountercurrentleachingofwasterandomaccessmemorychipsinacunh3so4systemutilizingcuiiasanoxidizer