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Revealing the aging process of solid electrolyte interphase on SiO(x) anode
As one of the most promising alternatives to graphite negative electrodes, silicon oxide (SiO(x)) has been hindered by its fast capacity fading. Solid electrolyte interphase (SEI) aging on silicon SiO(x) has been recognized as the most critical yet least understood facet. Herein, leveraging 3D focus...
Autores principales: | , , , , , , , , , , , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10539371/ https://www.ncbi.nlm.nih.gov/pubmed/37770484 http://dx.doi.org/10.1038/s41467-023-41867-6 |
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author | Qian, Guoyu Li, Yiwei Chen, Haibiao Xie, Lin Liu, Tongchao Yang, Ni Song, Yongli Lin, Cong Cheng, Junfang Nakashima, Naotoshi Zhang, Meng Li, Zikun Zhao, Wenguang Yang, Xiangjie Lin, Hai Lu, Xia Yang, Luyi Li, Hong Amine, Khalil Chen, Liquan Pan, Feng |
author_facet | Qian, Guoyu Li, Yiwei Chen, Haibiao Xie, Lin Liu, Tongchao Yang, Ni Song, Yongli Lin, Cong Cheng, Junfang Nakashima, Naotoshi Zhang, Meng Li, Zikun Zhao, Wenguang Yang, Xiangjie Lin, Hai Lu, Xia Yang, Luyi Li, Hong Amine, Khalil Chen, Liquan Pan, Feng |
author_sort | Qian, Guoyu |
collection | PubMed |
description | As one of the most promising alternatives to graphite negative electrodes, silicon oxide (SiO(x)) has been hindered by its fast capacity fading. Solid electrolyte interphase (SEI) aging on silicon SiO(x) has been recognized as the most critical yet least understood facet. Herein, leveraging 3D focused ion beam-scanning electron microscopy (FIB-SEM) tomographic imaging, we reveal an exceptionally characteristic SEI microstructure with an incompact inner region and a dense outer region, which overturns the prevailing belief that SEIs are homogeneous structure and reveals the SEI evolution process. Through combining nanoprobe and electron energy loss spectroscopy (EELS), it is also discovered that the electronic conductivity of thick SEI relies on the percolation network within composed of conductive agents (e.g., carbon black particles), which are embedded into the SEI upon its growth. Therefore, the free growth of SEI will gradually attenuate this electron percolation network, thereby causing capacity decay of SiO(x). Based on these findings, a proof-of-concept strategy is adopted to mechanically restrict the SEI growth via applying a confining layer on top of the electrode. Through shedding light on the fundamental understanding of SEI aging for SiO(x) anodes, this work could potentially inspire viable improving strategies in the future. |
format | Online Article Text |
id | pubmed-10539371 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-105393712023-09-30 Revealing the aging process of solid electrolyte interphase on SiO(x) anode Qian, Guoyu Li, Yiwei Chen, Haibiao Xie, Lin Liu, Tongchao Yang, Ni Song, Yongli Lin, Cong Cheng, Junfang Nakashima, Naotoshi Zhang, Meng Li, Zikun Zhao, Wenguang Yang, Xiangjie Lin, Hai Lu, Xia Yang, Luyi Li, Hong Amine, Khalil Chen, Liquan Pan, Feng Nat Commun Article As one of the most promising alternatives to graphite negative electrodes, silicon oxide (SiO(x)) has been hindered by its fast capacity fading. Solid electrolyte interphase (SEI) aging on silicon SiO(x) has been recognized as the most critical yet least understood facet. Herein, leveraging 3D focused ion beam-scanning electron microscopy (FIB-SEM) tomographic imaging, we reveal an exceptionally characteristic SEI microstructure with an incompact inner region and a dense outer region, which overturns the prevailing belief that SEIs are homogeneous structure and reveals the SEI evolution process. Through combining nanoprobe and electron energy loss spectroscopy (EELS), it is also discovered that the electronic conductivity of thick SEI relies on the percolation network within composed of conductive agents (e.g., carbon black particles), which are embedded into the SEI upon its growth. Therefore, the free growth of SEI will gradually attenuate this electron percolation network, thereby causing capacity decay of SiO(x). Based on these findings, a proof-of-concept strategy is adopted to mechanically restrict the SEI growth via applying a confining layer on top of the electrode. Through shedding light on the fundamental understanding of SEI aging for SiO(x) anodes, this work could potentially inspire viable improving strategies in the future. Nature Publishing Group UK 2023-09-28 /pmc/articles/PMC10539371/ /pubmed/37770484 http://dx.doi.org/10.1038/s41467-023-41867-6 Text en © The Author(s) 2023 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) . |
spellingShingle | Article Qian, Guoyu Li, Yiwei Chen, Haibiao Xie, Lin Liu, Tongchao Yang, Ni Song, Yongli Lin, Cong Cheng, Junfang Nakashima, Naotoshi Zhang, Meng Li, Zikun Zhao, Wenguang Yang, Xiangjie Lin, Hai Lu, Xia Yang, Luyi Li, Hong Amine, Khalil Chen, Liquan Pan, Feng Revealing the aging process of solid electrolyte interphase on SiO(x) anode |
title | Revealing the aging process of solid electrolyte interphase on SiO(x) anode |
title_full | Revealing the aging process of solid electrolyte interphase on SiO(x) anode |
title_fullStr | Revealing the aging process of solid electrolyte interphase on SiO(x) anode |
title_full_unstemmed | Revealing the aging process of solid electrolyte interphase on SiO(x) anode |
title_short | Revealing the aging process of solid electrolyte interphase on SiO(x) anode |
title_sort | revealing the aging process of solid electrolyte interphase on sio(x) anode |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10539371/ https://www.ncbi.nlm.nih.gov/pubmed/37770484 http://dx.doi.org/10.1038/s41467-023-41867-6 |
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