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Strategy to simulate and fit 2D grazing-incidence small-angle X-ray scattering patterns of nanostructured thin films

Grazing-incidence small-angle X-ray scattering (GISAXS) is a widely used method for the characterization of the nanostructure of supported thin films and enables time-resolved in situ measurements. The 2D scattering patterns contain detailed information about the nanostructures within the film and a...

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Detalles Bibliográficos
Autores principales: Jung, Florian A., Papadakis, Christine M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10543672/
https://www.ncbi.nlm.nih.gov/pubmed/37791363
http://dx.doi.org/10.1107/S1600576723006520

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