Cargando…

Storage reliability prediction of electromechanical components based on virtual manufacturing and testing

Electromechanical components (EMCs) such as relays and contactors have been used extensively in industrial and military areas. The storage reliability of these EMCs has a direct impact on the reliability of the system that contains them. However, during the design phase, it is difficult to predict t...

Descripción completa

Detalles Bibliográficos
Autores principales: Lin, Yigang, He, Tao, Zhu, Haotong, Lin, Yichen, Chen, Qiuying
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10562785/
https://www.ncbi.nlm.nih.gov/pubmed/37822626
http://dx.doi.org/10.1016/j.heliyon.2023.e20549
_version_ 1785118207244238848
author Lin, Yigang
He, Tao
Zhu, Haotong
Lin, Yichen
Chen, Qiuying
author_facet Lin, Yigang
He, Tao
Zhu, Haotong
Lin, Yichen
Chen, Qiuying
author_sort Lin, Yigang
collection PubMed
description Electromechanical components (EMCs) such as relays and contactors have been used extensively in industrial and military areas. The storage reliability of these EMCs has a direct impact on the reliability of the system that contains them. However, during the design phase, it is difficult to predict the storage reliability of EMCs because of few failure rate data of parts, as well as limited testing time and budgets. To address these problems, a virtual Manufacturing and testing method is proposed in this paper, so as to simulate the storage degradation process of batch EMCs. By considering the influence of the quality screening process in the manufacturing process, as well as the unit-to-unit variability of EMCs on the storage degradation paths and the overall life distribution of batch products, the storage failure distribution function is obtained, based on Wiener process. At the same time, the distribution of the diffusion coefficient in the degradation model and the failure distribution model is quantified by introducing testing data of related products as priori information, so as to reflect the uncertainty of the storage degradation process of EMCs. A case study of an electromagnetic relay is carried out to illustrate the effectiveness of the proposed approach.
format Online
Article
Text
id pubmed-10562785
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher Elsevier
record_format MEDLINE/PubMed
spelling pubmed-105627852023-10-11 Storage reliability prediction of electromechanical components based on virtual manufacturing and testing Lin, Yigang He, Tao Zhu, Haotong Lin, Yichen Chen, Qiuying Heliyon Research Article Electromechanical components (EMCs) such as relays and contactors have been used extensively in industrial and military areas. The storage reliability of these EMCs has a direct impact on the reliability of the system that contains them. However, during the design phase, it is difficult to predict the storage reliability of EMCs because of few failure rate data of parts, as well as limited testing time and budgets. To address these problems, a virtual Manufacturing and testing method is proposed in this paper, so as to simulate the storage degradation process of batch EMCs. By considering the influence of the quality screening process in the manufacturing process, as well as the unit-to-unit variability of EMCs on the storage degradation paths and the overall life distribution of batch products, the storage failure distribution function is obtained, based on Wiener process. At the same time, the distribution of the diffusion coefficient in the degradation model and the failure distribution model is quantified by introducing testing data of related products as priori information, so as to reflect the uncertainty of the storage degradation process of EMCs. A case study of an electromagnetic relay is carried out to illustrate the effectiveness of the proposed approach. Elsevier 2023-09-29 /pmc/articles/PMC10562785/ /pubmed/37822626 http://dx.doi.org/10.1016/j.heliyon.2023.e20549 Text en © 2023 The Authors. Published by Elsevier Ltd. https://creativecommons.org/licenses/by/4.0/This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Research Article
Lin, Yigang
He, Tao
Zhu, Haotong
Lin, Yichen
Chen, Qiuying
Storage reliability prediction of electromechanical components based on virtual manufacturing and testing
title Storage reliability prediction of electromechanical components based on virtual manufacturing and testing
title_full Storage reliability prediction of electromechanical components based on virtual manufacturing and testing
title_fullStr Storage reliability prediction of electromechanical components based on virtual manufacturing and testing
title_full_unstemmed Storage reliability prediction of electromechanical components based on virtual manufacturing and testing
title_short Storage reliability prediction of electromechanical components based on virtual manufacturing and testing
title_sort storage reliability prediction of electromechanical components based on virtual manufacturing and testing
topic Research Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10562785/
https://www.ncbi.nlm.nih.gov/pubmed/37822626
http://dx.doi.org/10.1016/j.heliyon.2023.e20549
work_keys_str_mv AT linyigang storagereliabilitypredictionofelectromechanicalcomponentsbasedonvirtualmanufacturingandtesting
AT hetao storagereliabilitypredictionofelectromechanicalcomponentsbasedonvirtualmanufacturingandtesting
AT zhuhaotong storagereliabilitypredictionofelectromechanicalcomponentsbasedonvirtualmanufacturingandtesting
AT linyichen storagereliabilitypredictionofelectromechanicalcomponentsbasedonvirtualmanufacturingandtesting
AT chenqiuying storagereliabilitypredictionofelectromechanicalcomponentsbasedonvirtualmanufacturingandtesting