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Pulsed Force Kelvin Probe Force Microscopy through Integration of Lock-In Detection

[Image: see text] Kelvin probe force microscopy measures surface potential and delivers insights into nanoscale electronic properties, including work function, doping levels, and localized charges. Recently developed pulsed force Kelvin probe force microscopy (PF-KPFM) provides sub-10 nm spatial res...

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Detalles Bibliográficos
Autores principales:	Zahmatkeshsaredorahi, Amirhossein, Jakob, Devon S., Fang, Hui, Fakhraai, Zahra, Xu, Xiaoji G.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	American Chemical Society 2023
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10571144/ https://www.ncbi.nlm.nih.gov/pubmed/37737103 http://dx.doi.org/10.1021/acs.nanolett.3c02452

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