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Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

In this paper, we provide a systematic review of atomic force microscopy (AFM), a fast-developing technique that embraces scanners, controllers, and cantilevers. The main objectives of this review are to analyze the available technical solutions of AFM, including the limitations and problems. The ma...

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Detalles Bibliográficos
Autores principales:	Dzedzickis, Andrius, Rožėnė, Justė, Bučinskas, Vytautas, Viržonis, Darius, Morkvėnaitė-Vilkončienė, Inga
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2023
Materias:	Review
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10573440/ https://www.ncbi.nlm.nih.gov/pubmed/37834515 http://dx.doi.org/10.3390/ma16196379

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