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Photoinduced Current Transient Spectroscopy on Metal Halide Perovskites: Electron Trapping and Ion Drift

[Image: see text] Metal halide perovskites (MHPs) are disruptive materials for a vast class of optoelectronic devices. The presence of electronic trap states has been a tough challenge in terms of characterization and thus mitigation. Many attempts based on electronic spectroscopies have been tested...

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Detalles Bibliográficos
Autores principales: Armaroli, Giovanni, Maserati, Lorenzo, Ciavatti, Andrea, Vecchi, Pierpaolo, Piccioni, Alberto, Foschi, Martina, Van der Meer, Valentina, Cortese, Chiara, Feldman, Matias, Foderà, Vito, Lemercier, Thibault, Zaccaro, Julien, Guillén, Javier Mayén, Gros-Daillon, Eric, Fraboni, Beatrice, Cavalcoli, Daniela
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2023
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10580305/
https://www.ncbi.nlm.nih.gov/pubmed/37854053
http://dx.doi.org/10.1021/acsenergylett.3c01429
Descripción
Sumario:[Image: see text] Metal halide perovskites (MHPs) are disruptive materials for a vast class of optoelectronic devices. The presence of electronic trap states has been a tough challenge in terms of characterization and thus mitigation. Many attempts based on electronic spectroscopies have been tested, but due to the mixed electronic–ionic nature of MHP conductivity, many experimental results retain a large ambiguity in resolving electronic and ionic charge contributions. Here we adapt a method, previously used in highly resistive inorganic semiconductors, called photoinduced current transient spectroscopy (PICTS) on lead bromide 2D-like ((PEA)(2)PbBr(4)) and standard “3D” (MAPbBr(3)) MHP single crystals. We present two conceptually different outcomes of the PICTS measurements, distinguishing the different electronic and ionic contributions to the photocurrents based on the different ion drift of the two materials. Our experiments unveil deep level trap states on the 2D, “ion-frozen” (PEA)(2)PbBr(4) and set new boundaries for the applicability of PICTS on 3D MHPs.