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Topological Darkness in Optical Heterostructures: Prediction and Confirmation

[Image: see text] Topological darkness is a new phenomenon that guarantees zero reflection/transmission of light from an optical sample and hence provides topologically nontrivial phase singularities. Here we consider topological darkness in an optical heterostructure that consists of an (unknown) l...

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Autores principales: Cusworth, Emma, Kravets, Vasyl G., Grigorenko, Alexander N.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2023
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10588908/
https://www.ncbi.nlm.nih.gov/pubmed/37869553
http://dx.doi.org/10.1021/acsphotonics.3c00879
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author Cusworth, Emma
Kravets, Vasyl G.
Grigorenko, Alexander N.
author_facet Cusworth, Emma
Kravets, Vasyl G.
Grigorenko, Alexander N.
author_sort Cusworth, Emma
collection PubMed
description [Image: see text] Topological darkness is a new phenomenon that guarantees zero reflection/transmission of light from an optical sample and hence provides topologically nontrivial phase singularities. Here we consider topological darkness in an optical heterostructure that consists of an (unknown) layer placed on a composite substrate and suggest an algorithm that can be used to predict and confirm the presence of topological darkness. The algorithm is based on a combination of optical measurements and the Fresnel equations. We apply this algorithm to ultrathin Pd films fabricated on a Si/SiO(2)/Cr substrate and extract four different points of topological darkness. Our results will be useful for topological photonics and label-free optical biosensing based on phase interrogation.
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spelling pubmed-105889082023-10-21 Topological Darkness in Optical Heterostructures: Prediction and Confirmation Cusworth, Emma Kravets, Vasyl G. Grigorenko, Alexander N. ACS Photonics [Image: see text] Topological darkness is a new phenomenon that guarantees zero reflection/transmission of light from an optical sample and hence provides topologically nontrivial phase singularities. Here we consider topological darkness in an optical heterostructure that consists of an (unknown) layer placed on a composite substrate and suggest an algorithm that can be used to predict and confirm the presence of topological darkness. The algorithm is based on a combination of optical measurements and the Fresnel equations. We apply this algorithm to ultrathin Pd films fabricated on a Si/SiO(2)/Cr substrate and extract four different points of topological darkness. Our results will be useful for topological photonics and label-free optical biosensing based on phase interrogation. American Chemical Society 2023-09-12 /pmc/articles/PMC10588908/ /pubmed/37869553 http://dx.doi.org/10.1021/acsphotonics.3c00879 Text en © 2023 The Authors. Published by American Chemical Society https://creativecommons.org/licenses/by/4.0/Permits the broadest form of re-use including for commercial purposes, provided that author attribution and integrity are maintained (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Cusworth, Emma
Kravets, Vasyl G.
Grigorenko, Alexander N.
Topological Darkness in Optical Heterostructures: Prediction and Confirmation
title Topological Darkness in Optical Heterostructures: Prediction and Confirmation
title_full Topological Darkness in Optical Heterostructures: Prediction and Confirmation
title_fullStr Topological Darkness in Optical Heterostructures: Prediction and Confirmation
title_full_unstemmed Topological Darkness in Optical Heterostructures: Prediction and Confirmation
title_short Topological Darkness in Optical Heterostructures: Prediction and Confirmation
title_sort topological darkness in optical heterostructures: prediction and confirmation
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10588908/
https://www.ncbi.nlm.nih.gov/pubmed/37869553
http://dx.doi.org/10.1021/acsphotonics.3c00879
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