Investigation of Erase Cycling Induced Joint Dummy Cell Disturbance in Dual-Deck 3D NAND Flash Memory

To satisfy the increasing demands for more word-line (WL) layers, the dual-deck even triple-deck architecture has emerged in 3D NAND Flash. However, the new reliability issues that occurred at the joint region of two decks became a severe challenge for developing multiple-deck technology. This work...

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Detalles Bibliográficos
Autores principales: You, Kaikai, Jin, Lei, Jia, Jianquan, Huo, Zongliang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10608846/
https://www.ncbi.nlm.nih.gov/pubmed/37893353
http://dx.doi.org/10.3390/mi14101916

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10608846/
https://www.ncbi.nlm.nih.gov/pubmed/37893353
http://dx.doi.org/10.3390/mi14101916

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