Cargando…
Investigation of Erase Cycling Induced Joint Dummy Cell Disturbance in Dual-Deck 3D NAND Flash Memory
To satisfy the increasing demands for more word-line (WL) layers, the dual-deck even triple-deck architecture has emerged in 3D NAND Flash. However, the new reliability issues that occurred at the joint region of two decks became a severe challenge for developing multiple-deck technology. This work...
| Autores principales: | , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2023
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10608846/ https://www.ncbi.nlm.nih.gov/pubmed/37893353 http://dx.doi.org/10.3390/mi14101916 |