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Simulation-Based Analysis of the Effect of Alpha Irradiation on GaN Particle Detectors
Radiation-hardened semiconductor GaN has drawn considerable attention owing to its excellent properties such as large displacement energy. Many studies have focused on evaluating the degradation of GaN-based power device performance by proton beam or particle irradiation, while quantitative analysis...
Autores principales: | Lei, Jianming, Wang, Nan, Jiang, Rukai, Hou, Qianyu |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10608986/ https://www.ncbi.nlm.nih.gov/pubmed/37893309 http://dx.doi.org/10.3390/mi14101872 |
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