A Fast Simulation Method for Evaluating the Single-Event Effect in Aerospace Integrated Circuits

With the continuous progress in integrated circuit technology, single-event effect (SEE) has become a key factor affecting the reliability of aerospace integrated circuits. Simulating fault injection using the computer simulation technique effectively reflects the SEE in aerospace integrated circuit...

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Detalles Bibliográficos
Autores principales: Zhang, Xiaorui, Liu, Yi, Xu, Changqing, Liao, Xinfang, Chen, Dongdong, Yang, Yintang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10609447/
https://www.ncbi.nlm.nih.gov/pubmed/37893324
http://dx.doi.org/10.3390/mi14101887

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10609447/
https://www.ncbi.nlm.nih.gov/pubmed/37893324
http://dx.doi.org/10.3390/mi14101887

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