A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser

Many coherent imaging applications that utilize ultrafast X-ray free-electron laser (XFEL) radiation pulses are highly sensitive to fluctuations in the shot-to-shot statistical properties of the source. Understanding and modelling these fluctuations are key to successful experiment planning and nece...

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Detalles Bibliográficos
Autores principales: Guest, Trey W., Bean, Richard, Kammering, Raimund, van Riessen, Grant, Mancuso, Adrian P., Abbey, Brian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2023
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10619450/
https://www.ncbi.nlm.nih.gov/pubmed/37782462
http://dx.doi.org/10.1107/S2052252523008242

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10619450/
https://www.ncbi.nlm.nih.gov/pubmed/37782462
http://dx.doi.org/10.1107/S2052252523008242

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