In situ synchrotron X-ray total scattering measurements and analysis of colloidal CsPbX (3) nanocrystals during flow synthesis

In situ X-ray scattering measurements of CsPbX (3) (X = Cl, Br, I) nanocrystal formation and halide exchange at NSLS-II beamlines were performed in an automated flow reactor. Total scattering measurements were performed at the 28-ID-2 (XPD) beamline and small-angle X-ray scattering at the 16-ID (LiX...

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Detalles Bibliográficos
Autores principales: Greenberg, Matthew W., Lin, Cheng-Hung, Chodankar, Shirish, Ghose, Sanjit K.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2023
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10624037/
https://www.ncbi.nlm.nih.gov/pubmed/37738031
http://dx.doi.org/10.1107/S1600577523007300
Descripción
Sumario:In situ X-ray scattering measurements of CsPbX (3) (X = Cl, Br, I) nanocrystal formation and halide exchange at NSLS-II beamlines were performed in an automated flow reactor. Total scattering measurements were performed at the 28-ID-2 (XPD) beamline and small-angle X-ray scattering at the 16-ID (LiX) beamline. Nanocrystal structural parameters of interest, including size, size distribution and atomic structure, were extracted from modeling the total scattering data. The results highlight the potential of these beamlines and the measurement protocols described in this study for studying dynamic processes of colloidal nanocrystal synthesis in solution with timescales on the order of seconds.

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