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Resonant X-ray emission spectroscopy using self-seeded hard X-ray pulses at PAL-XFEL

Self-seeded hard X-ray pulses at PAL-XFEL were used to commission a resonant X-ray emission spectroscopy experiment with a von Hamos spectrometer. The self-seeded beam, generated through forward Bragg diffraction of the [202] peak in a 100 µm-thick diamond crystal, exhibited an average bandwidth of...

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Detalles Bibliográficos
Autores principales: Choi, Tae-Kyu, Park, Jaeku, Kim, Gyujin, Jang, Hoyoung, Park, Sang-Youn, Sohn, Jang Hyeob, Cho, Byoung Ick, Kim, Hyunjung, Kim, Kyung Sook, Nam, Inhyuk, Chun, Sae Hwan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10624040/
https://www.ncbi.nlm.nih.gov/pubmed/37738032
http://dx.doi.org/10.1107/S1600577523007312
Descripción
Sumario:Self-seeded hard X-ray pulses at PAL-XFEL were used to commission a resonant X-ray emission spectroscopy experiment with a von Hamos spectrometer. The self-seeded beam, generated through forward Bragg diffraction of the [202] peak in a 100 µm-thick diamond crystal, exhibited an average bandwidth of 0.54 eV at 11.223 keV. A coordinated scanning scheme of electron bunch energy, diamond crystal angle and silicon monochromator allowed us to map the Ir Lβ(2) X-ray emission lines of IrO(2) powder across the Ir L (3)-absorption edge, from 11.212 to 11.242 keV with an energy step of 0.3 eV. This work provides a reference for hard X-ray emission spectroscopy experiments utilizing self-seeded pulses with a narrow bandwidth, eventually applicable for pump–probe studies in solid-state and diluted systems.