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Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and Scalability

[Image: see text] Memtransistors that combine the properties of transistor and memristor hold significant promise for in-memory computing. While superior data storage capability is achieved in memtransistors through gate voltage-induced conductance modulation, the lateral device configuration would...

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Autores principales: Sivan, Maheswari, Leong, Jin Feng, Ghosh, Joydeep, Tang, Baoshan, Pan, Jieming, Zamburg, Evgeny, Thean, Aaron Voon-Yew
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2022
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10653274/
https://www.ncbi.nlm.nih.gov/pubmed/36103401
http://dx.doi.org/10.1021/acsnano.2c04504
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author Sivan, Maheswari
Leong, Jin Feng
Ghosh, Joydeep
Tang, Baoshan
Pan, Jieming
Zamburg, Evgeny
Thean, Aaron Voon-Yew
author_facet Sivan, Maheswari
Leong, Jin Feng
Ghosh, Joydeep
Tang, Baoshan
Pan, Jieming
Zamburg, Evgeny
Thean, Aaron Voon-Yew
author_sort Sivan, Maheswari
collection PubMed
description [Image: see text] Memtransistors that combine the properties of transistor and memristor hold significant promise for in-memory computing. While superior data storage capability is achieved in memtransistors through gate voltage-induced conductance modulation, the lateral device configuration would not only result in high write bias, which compromises the power efficiency, but also suffers from unsuccessful memory reset that leads to reliability concerns. To circumvent such performance limitations, an advanced physics-based model is required to uncover the dynamic resistive switching behavior and deduce the key driving parameters for the switching process. This work demonstrates a self-consistent physics-based model which incorporates the often-overlooked effects of lattice temperature, vacancy dynamics, and channel electrostatics to accurately solve the interaction between gate potential, ions, and carriers on the memristive switching mechanism. The completed model is carefully calibrated with an ambipolar WSe(2) memtransistor and hence enables the investigation of the carrier polarity effect (electrons vs holes) on vacancy transport. Nevertheless, the validity of the model can be extended to different materials by a simple material-dependent parameter modification. Building upon the existing understanding of Schottky barrier height modulation, our study reveals three key insights—leveraging threshold voltage shifts to lower write bias; optimizing lattice temperature distribution and read bias polarity to achieve successful memory state recovery; engineering contact work function to overcome the detrimental parasitic current flow in short channel ambipolar memtransistors. Therefore, understanding the significant correlation between the switching mechanisms, different material systems, and device structures allows performance optimization of operating modes and device designs for future memtransistors-based computing systems.
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spelling pubmed-106532742023-11-16 Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and Scalability Sivan, Maheswari Leong, Jin Feng Ghosh, Joydeep Tang, Baoshan Pan, Jieming Zamburg, Evgeny Thean, Aaron Voon-Yew ACS Nano [Image: see text] Memtransistors that combine the properties of transistor and memristor hold significant promise for in-memory computing. While superior data storage capability is achieved in memtransistors through gate voltage-induced conductance modulation, the lateral device configuration would not only result in high write bias, which compromises the power efficiency, but also suffers from unsuccessful memory reset that leads to reliability concerns. To circumvent such performance limitations, an advanced physics-based model is required to uncover the dynamic resistive switching behavior and deduce the key driving parameters for the switching process. This work demonstrates a self-consistent physics-based model which incorporates the often-overlooked effects of lattice temperature, vacancy dynamics, and channel electrostatics to accurately solve the interaction between gate potential, ions, and carriers on the memristive switching mechanism. The completed model is carefully calibrated with an ambipolar WSe(2) memtransistor and hence enables the investigation of the carrier polarity effect (electrons vs holes) on vacancy transport. Nevertheless, the validity of the model can be extended to different materials by a simple material-dependent parameter modification. Building upon the existing understanding of Schottky barrier height modulation, our study reveals three key insights—leveraging threshold voltage shifts to lower write bias; optimizing lattice temperature distribution and read bias polarity to achieve successful memory state recovery; engineering contact work function to overcome the detrimental parasitic current flow in short channel ambipolar memtransistors. Therefore, understanding the significant correlation between the switching mechanisms, different material systems, and device structures allows performance optimization of operating modes and device designs for future memtransistors-based computing systems. American Chemical Society 2022-09-14 /pmc/articles/PMC10653274/ /pubmed/36103401 http://dx.doi.org/10.1021/acsnano.2c04504 Text en © 2022 American Chemical Society https://creativecommons.org/licenses/by-nc-nd/4.0/Permits non-commercial access and re-use, provided that author attribution and integrity are maintained; but does not permit creation of adaptations or other derivative works (https://creativecommons.org/licenses/by-nc-nd/4.0/).
spellingShingle Sivan, Maheswari
Leong, Jin Feng
Ghosh, Joydeep
Tang, Baoshan
Pan, Jieming
Zamburg, Evgeny
Thean, Aaron Voon-Yew
Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and Scalability
title Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and Scalability
title_full Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and Scalability
title_fullStr Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and Scalability
title_full_unstemmed Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and Scalability
title_short Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and Scalability
title_sort physical insights into vacancy-based memtransistors: toward power efficiency, reliable operation, and scalability
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10653274/
https://www.ncbi.nlm.nih.gov/pubmed/36103401
http://dx.doi.org/10.1021/acsnano.2c04504
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