Direct imaging of electron density with a scanning transmission electron microscope

Recent studies of secondary electron (SE) emission in scanning transmission electron microscopes suggest that material’s properties such as electrical conductivity, connectivity, and work function can be probed with atomic scale resolution using a technique known as secondary electron e-beam-induced...

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Detalles Bibliográficos
Autores principales: Dyck, Ondrej, Almutlaq, Jawaher, Lingerfelt, David, Swett, Jacob L., Oxley, Mark P., Huang, Bevin, Lupini, Andrew R., Englund, Dirk, Jesse, Stephen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10662251/
https://www.ncbi.nlm.nih.gov/pubmed/37985658
http://dx.doi.org/10.1038/s41467-023-42256-9

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10662251/
https://www.ncbi.nlm.nih.gov/pubmed/37985658
http://dx.doi.org/10.1038/s41467-023-42256-9

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