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Systematical Investigation of Flicker Noise in 14 nm FinFET Devices towards Stochastic Computing Application

Stochastic computing (SC) is widely known for its high error tolerance and efficient computing ability of complex functions with remarkably simple logic gates. The noise of electronic devices is widely used to be the entropy source due to its randomness. Compared with thermal noise and random telegr...

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Detalles Bibliográficos
Autores principales:	Dong, Danian, Lai, Jinru, Yang, Yan, Gong, Tiancheng, Zheng, Xu, Sun, Wenxuan, Yu, Jie, Fan, Shaoyang, Xu, Xiaoxin
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2023
Materias:	Brief Report
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10673334/ https://www.ncbi.nlm.nih.gov/pubmed/38004955 http://dx.doi.org/10.3390/mi14112098

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