A Fault Diagnosis Strategy for Analog Circuits with Limited Samples Based on the Combination of the Transformer and Generative Models

As a pivotal integral component within electronic systems, analog circuits are of paramount importance for the timely detection and precise diagnosis of their faults. However, the objective reality of limited fault samples in operational devices with analog circuitry poses challenges to the direct applicability of existing diagnostic methods. This study proposes an innovative approach for fault diagnosis in analog circuits by integrating deep convolutional generative adversarial networks (DCGANs) with the Transformer architecture, addressing the problem of insufficient fault samples affecting diagnostic performance. Firstly, the employment of the continuous wavelet transform in combination with Morlet wavelet basis functions serves as a means to derive time–frequency images, enhancing fault feature recognition while converting time-domain signals into time–frequency representations. Furthermore, the augmentation of datasets utilizing deep convolutional GANs is employed to generate synthetic time–frequency signals from existing fault data. The Transformer-based fault diagnosis model was trained using a mixture of original signals and generated signals, and the model was subsequently tested. Through experiments involving single and multiple fault scenarios in three simulated circuits, a comparative analysis of the proposed approach was conducted with a number of established benchmark methods, and its effectiveness in various scenarios was evaluated. In addition, the ability of the proposed fault diagnosis technique was investigated in the presence of limited fault data samples. The outcome reveals that the proposed diagnostic method exhibits a consistently high overall accuracy of over 96% in diverse test scenarios. Moreover, it delivers satisfactory performance even when real sample sizes are as small as 150 instances in various fault categories.