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ELECTRON MICROSCOPIC OBSERVATION OF SPECIMENS UNDER CONTROLLED GAS PRESSURE
A technique for encasing specimens in a thin gas layer during their observation in the Siemens Elmiskop I is described. All gases can be employed at pressures up to one atmosphere. Destruction of specimens can occur in the beam; all organic specimens are particularly liable to decompose. The conditi...
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| Formato: | Texto |
| Lenguaje: | English |
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The Rockefeller University Press
1962
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2106054/ https://www.ncbi.nlm.nih.gov/pubmed/13905967 |