ABSOLUTE SENSITIVITY OF ELECTRON MICROSCOPE RADIOAUTOGRAPHY

A calibration method is described for measuring absolute radioautographic sensitivities under various experimental conditions. Sensitivities to (3)H and (35)S radiation, i.e. ratio of developed grains to radioactive decays in the specimen, were determined with Ilford L4 and Kodak NTE emulsions. The...

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Detalles Bibliográficos
Autores principales: Bachmann, L., Salpeter, M. M.
Formato: Texto
Lenguaje:English
Publicado: The Rockefeller University Press 1967
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2108360/
https://www.ncbi.nlm.nih.gov/pubmed/6039374
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author Bachmann, L.
Salpeter, M. M.
author_facet Bachmann, L.
Salpeter, M. M.
author_sort Bachmann, L.
collection PubMed
description A calibration method is described for measuring absolute radioautographic sensitivities under various experimental conditions. Sensitivities to (3)H and (35)S radiation, i.e. ratio of developed grains to radioactive decays in the specimen, were determined with Ilford L4 and Kodak NTE emulsions. The highest values obtained in monolayers of emulsion were ⅛ for (3)H and 1/21 for (35)S. The influence of various experimental parameters on sensitivity is described, and the possibilities for quantitative electron microscope radioautography are discussed.
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spelling pubmed-21083602008-05-01 ABSOLUTE SENSITIVITY OF ELECTRON MICROSCOPE RADIOAUTOGRAPHY Bachmann, L. Salpeter, M. M. J Cell Biol Article A calibration method is described for measuring absolute radioautographic sensitivities under various experimental conditions. Sensitivities to (3)H and (35)S radiation, i.e. ratio of developed grains to radioactive decays in the specimen, were determined with Ilford L4 and Kodak NTE emulsions. The highest values obtained in monolayers of emulsion were ⅛ for (3)H and 1/21 for (35)S. The influence of various experimental parameters on sensitivity is described, and the possibilities for quantitative electron microscope radioautography are discussed. The Rockefeller University Press 1967-05-01 /pmc/articles/PMC2108360/ /pubmed/6039374 Text en Copyright © 1967 by The Rockefeller University Press This article is distributed under the terms of an Attribution–Noncommercial–Share Alike–No Mirror Sites license for the first six months after the publication date (see http://www.rupress.org/terms). After six months it is available under a Creative Commons License (Attribution–Noncommercial–Share Alike 4.0 Unported license, as described at http://creativecommons.org/licenses/by-nc-sa/4.0/).
spellingShingle Article
Bachmann, L.
Salpeter, M. M.
ABSOLUTE SENSITIVITY OF ELECTRON MICROSCOPE RADIOAUTOGRAPHY
title ABSOLUTE SENSITIVITY OF ELECTRON MICROSCOPE RADIOAUTOGRAPHY
title_full ABSOLUTE SENSITIVITY OF ELECTRON MICROSCOPE RADIOAUTOGRAPHY
title_fullStr ABSOLUTE SENSITIVITY OF ELECTRON MICROSCOPE RADIOAUTOGRAPHY
title_full_unstemmed ABSOLUTE SENSITIVITY OF ELECTRON MICROSCOPE RADIOAUTOGRAPHY
title_short ABSOLUTE SENSITIVITY OF ELECTRON MICROSCOPE RADIOAUTOGRAPHY
title_sort absolute sensitivity of electron microscope radioautography
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2108360/
https://www.ncbi.nlm.nih.gov/pubmed/6039374
work_keys_str_mv AT bachmannl absolutesensitivityofelectronmicroscoperadioautography
AT salpetermm absolutesensitivityofelectronmicroscoperadioautography

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