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Total Charge Movement per Channel : The Relation between Gating Charge Displacement and the Voltage Sensitivity of Activation

One measure of the voltage dependence of ion channel conductance is the amount of gating charge that moves during activation and vice versa. The limiting slope method, introduced by Almers (Almers, W. 1978. Rev. Physiol. Biochem. Pharmacol. 82:96–190), exploits the relationship of charge movement an...

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Detalles Bibliográficos
Autores principales: Sigg, Daniel, Bezanilla, Francisco
Formato: Texto
Lenguaje:English
Publicado: The Rockefeller University Press 1997
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2217050/
https://www.ncbi.nlm.nih.gov/pubmed/8997663
_version_ 1782149211712651264
author Sigg, Daniel
Bezanilla, Francisco
author_facet Sigg, Daniel
Bezanilla, Francisco
author_sort Sigg, Daniel
collection PubMed
description One measure of the voltage dependence of ion channel conductance is the amount of gating charge that moves during activation and vice versa. The limiting slope method, introduced by Almers (Almers, W. 1978. Rev. Physiol. Biochem. Pharmacol. 82:96–190), exploits the relationship of charge movement and voltage sensitivity, yielding a lower limit to the range of single channel gating charge displacement. In practice, the technique is plagued by low experimental resolution due to the requirement that the logarithmic voltage sensitivity of activation be measured at very low probabilities of opening. In addition, the linear sequential models to which the original theory was restricted needed to be expanded to accommodate the complexity of mechanisms available for the activation of channels. In this communication, we refine the theory by developing a relationship between the mean activation charge displacement (a measure of the voltage sensitivity of activation) and the gating charge displacement (the integral of gating current). We demonstrate that recording the equilibrium gating charge displacement as an adjunct to the limiting slope technique greatly improves accuracy under conditions where the plots of mean activation charge displacement and gross gating charge displacement versus voltage can be superimposed. We explore this relationship for a wide variety of channel models, which include those having a continuous density of states, nonsequential activation pathways, and subconductance states. We introduce new criteria for the appropriate use of the limiting slope procedure and provide a practical example of the theory applied to low resolution simulation data.
format Text
id pubmed-2217050
institution National Center for Biotechnology Information
language English
publishDate 1997
publisher The Rockefeller University Press
record_format MEDLINE/PubMed
spelling pubmed-22170502008-04-22 Total Charge Movement per Channel : The Relation between Gating Charge Displacement and the Voltage Sensitivity of Activation Sigg, Daniel Bezanilla, Francisco J Gen Physiol Article One measure of the voltage dependence of ion channel conductance is the amount of gating charge that moves during activation and vice versa. The limiting slope method, introduced by Almers (Almers, W. 1978. Rev. Physiol. Biochem. Pharmacol. 82:96–190), exploits the relationship of charge movement and voltage sensitivity, yielding a lower limit to the range of single channel gating charge displacement. In practice, the technique is plagued by low experimental resolution due to the requirement that the logarithmic voltage sensitivity of activation be measured at very low probabilities of opening. In addition, the linear sequential models to which the original theory was restricted needed to be expanded to accommodate the complexity of mechanisms available for the activation of channels. In this communication, we refine the theory by developing a relationship between the mean activation charge displacement (a measure of the voltage sensitivity of activation) and the gating charge displacement (the integral of gating current). We demonstrate that recording the equilibrium gating charge displacement as an adjunct to the limiting slope technique greatly improves accuracy under conditions where the plots of mean activation charge displacement and gross gating charge displacement versus voltage can be superimposed. We explore this relationship for a wide variety of channel models, which include those having a continuous density of states, nonsequential activation pathways, and subconductance states. We introduce new criteria for the appropriate use of the limiting slope procedure and provide a practical example of the theory applied to low resolution simulation data. The Rockefeller University Press 1997-01-01 /pmc/articles/PMC2217050/ /pubmed/8997663 Text en This article is distributed under the terms of an Attribution–Noncommercial–Share Alike–No Mirror Sites license for the first six months after the publication date (see http://www.rupress.org/terms). After six months it is available under a Creative Commons License (Attribution–Noncommercial–Share Alike 4.0 Unported license, as described at http://creativecommons.org/licenses/by-nc-sa/4.0/).
spellingShingle Article
Sigg, Daniel
Bezanilla, Francisco
Total Charge Movement per Channel : The Relation between Gating Charge Displacement and the Voltage Sensitivity of Activation
title Total Charge Movement per Channel : The Relation between Gating Charge Displacement and the Voltage Sensitivity of Activation
title_full Total Charge Movement per Channel : The Relation between Gating Charge Displacement and the Voltage Sensitivity of Activation
title_fullStr Total Charge Movement per Channel : The Relation between Gating Charge Displacement and the Voltage Sensitivity of Activation
title_full_unstemmed Total Charge Movement per Channel : The Relation between Gating Charge Displacement and the Voltage Sensitivity of Activation
title_short Total Charge Movement per Channel : The Relation between Gating Charge Displacement and the Voltage Sensitivity of Activation
title_sort total charge movement per channel : the relation between gating charge displacement and the voltage sensitivity of activation
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2217050/
https://www.ncbi.nlm.nih.gov/pubmed/8997663
work_keys_str_mv AT siggdaniel totalchargemovementperchanneltherelationbetweengatingchargedisplacementandthevoltagesensitivityofactivation
AT bezanillafrancisco totalchargemovementperchanneltherelationbetweengatingchargedisplacementandthevoltagesensitivityofactivation