Cargando…
Application of normal-mode refinement to X-ray crystal structures at the lower resolution limit
The structural refinement of large complexes at the lower resolution limit is often difficult and inefficient owing to the limited number of reflections and the frequently high-level structural flexibility. A new normal-mode-based X-ray crystallographic refinement method has recently been developed...
Autores principales: | Ni, Fengyun, Poon, Billy K., Wang, Qinghua, Ma, Jianpeng |
---|---|
Formato: | Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2009
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2703569/ https://www.ncbi.nlm.nih.gov/pubmed/19564683 http://dx.doi.org/10.1107/S0907444909010695 |
Ejemplares similares
-
Interpretation of very low resolution X-ray electron-density maps using core objects
por: Heuser, Philipp, et al.
Publicado: (2009) -
Introducing robustness to maximum-likelihood refinement of electron-microsopy data
por: Scheres, Sjors H. W., et al.
Publicado: (2009) -
Confidence intervals for fitting of atomic models into low-resolution densities
por: Volkmann, Niels
Publicado: (2009) -
The Max-Inf2/Lorentz Center workshop on New algorithms in macromolecular crystallography and electron microscopy
por: Pannu, Navraj S., et al.
Publicado: (2009) -
Unit-cell determination from randomly oriented electron-diffraction patterns
por: Jiang, Linhua, et al.
Publicado: (2009)