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Confidence intervals for fitting of atomic models into low-resolution densities
The fitting of high-resolution structures into low-resolution densities obtained from techniques such as electron microscopy or small-angle X-ray scattering can yield powerful new insights. While several algorithms for achieving optimal fits have recently been developed, relatively little effort has...
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2009
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2703574/ https://www.ncbi.nlm.nih.gov/pubmed/19564688 http://dx.doi.org/10.1107/S0907444909012876 |