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Use of a hexapod in diffraction measurements of substrate-supported crystals of organic semiconductors
Thin films of organic semiconductor prepared on substrates generally contain crystals that have one common crystal plane parallel to the substrate but random in-plane orientations. In diffraction measurements of these structures, it is often required to anchor the X-ray beam on a fixed spot on the s...
| Autores principales: | , |
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2009
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2765084/ https://www.ncbi.nlm.nih.gov/pubmed/19844015 http://dx.doi.org/10.1107/S0909049509037911 |