Nanomechanical Characterization of Indium Nano/Microwires

Nanomechanical properties of indium nanowires like structures fabricated on quartz substrate by trench template technique, measured using nanoindentation. The hardness and elastic modulus of wires were measured and compared with the values of indium thin film. Displacement burst observed while inden...

Descripción completa

Detalles Bibliográficos
Autores principales: Kumar, Prashant, N Kiran, MSR
Formato: Texto
Lenguaje:English
Publicado: Springer 2010
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2893830/
https://www.ncbi.nlm.nih.gov/pubmed/20596474
http://dx.doi.org/10.1007/s11671-010-9606-1
_version_ 1782183077768855552
author Kumar, Prashant
N Kiran, MSR
author_facet Kumar, Prashant
N Kiran, MSR
author_sort Kumar, Prashant
collection PubMed
description Nanomechanical properties of indium nanowires like structures fabricated on quartz substrate by trench template technique, measured using nanoindentation. The hardness and elastic modulus of wires were measured and compared with the values of indium thin film. Displacement burst observed while indenting the nanowire. ‘Wire-only hardness’ obtained using Korsunsky model from composite hardness. Nanowires have exhibited almost same modulus as indium thin film but considerable changes were observed in hardness value.
format Text
id pubmed-2893830
institution National Center for Biotechnology Information
language English
publishDate 2010
publisher Springer
record_format MEDLINE/PubMed
spelling pubmed-28938302010-06-30 Nanomechanical Characterization of Indium Nano/Microwires Kumar, Prashant N Kiran, MSR Nanoscale Res Lett Nano Express Nanomechanical properties of indium nanowires like structures fabricated on quartz substrate by trench template technique, measured using nanoindentation. The hardness and elastic modulus of wires were measured and compared with the values of indium thin film. Displacement burst observed while indenting the nanowire. ‘Wire-only hardness’ obtained using Korsunsky model from composite hardness. Nanowires have exhibited almost same modulus as indium thin film but considerable changes were observed in hardness value. Springer 2010-04-22 /pmc/articles/PMC2893830/ /pubmed/20596474 http://dx.doi.org/10.1007/s11671-010-9606-1 Text en Copyright © 2010 The Author(s) https://creativecommons.org/licenses/by-nc/4.0/ This article is distributed under the terms of the Creative Commons Attribution Noncommercial License which permits any noncommercial use, distribution, and reproduction in any medium, provided the original author(s) and source are credited.
spellingShingle Nano Express
Kumar, Prashant
N Kiran, MSR
Nanomechanical Characterization of Indium Nano/Microwires
title Nanomechanical Characterization of Indium Nano/Microwires
title_full Nanomechanical Characterization of Indium Nano/Microwires
title_fullStr Nanomechanical Characterization of Indium Nano/Microwires
title_full_unstemmed Nanomechanical Characterization of Indium Nano/Microwires
title_short Nanomechanical Characterization of Indium Nano/Microwires
title_sort nanomechanical characterization of indium nano/microwires
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2893830/
https://www.ncbi.nlm.nih.gov/pubmed/20596474
http://dx.doi.org/10.1007/s11671-010-9606-1
work_keys_str_mv AT kumarprashant nanomechanicalcharacterizationofindiumnanomicrowires
AT nkiranmsr nanomechanicalcharacterizationofindiumnanomicrowires

Ejemplares similares