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Creation of Controlled Defects Inside Colloidal Crystal Arrays with a Focused Ion Beam
In this work the reliability of the focused-ion-beam (FIB) patterning on polystyrene (PS) colloidal crystals at different scales is determined. Ordered arrays of PS spheres (465 nm) are successfully modified by selectively removing a single sphere. The water-vapor assisted FIB milling is crucial to...
| Autores principales: | , |
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2010
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2894035/ https://www.ncbi.nlm.nih.gov/pubmed/20596416 http://dx.doi.org/10.1007/s11671-010-9623-0 |