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Nano-regime Length Scales Extracted from the First Sharp Diffraction Peak in Non-crystalline SiO(2) and Related Materials: Device Applications
This paper distinguishes between two different scales of medium range order, MRO, in non-crystalline SiO(2): (1) the first is ~0.4 to 0.5 nm and is obtained from the position of the first sharp diffraction peak, FSDP, in the X-ray diffraction structure factor, S(Q), and (2) the second is ~1 nm and i...
| Autores principales: | , |
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| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2010
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2894147/ https://www.ncbi.nlm.nih.gov/pubmed/20672114 http://dx.doi.org/10.1007/s11671-009-9520-6 |