Cargando…
Residual Stress Relaxation Induced by Mass Transport Through Interface of the Pd/SrTiO(3)
Metal interconnections having a small cross-section and short length can be subjected to very large mass transport due to the passing of high current densities. As a result, nonlinear diffusion and electromigration effects which may result in device failure and electrical instabilities may be manife...
| Autores principales: | , , , , |
|---|---|
| Formato: | Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2010
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2894343/ https://www.ncbi.nlm.nih.gov/pubmed/20672036 http://dx.doi.org/10.1007/s11671-010-9535-z |