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High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies
The concepts and technical realisation of the high-resolution soft X-ray beamline ADRESS operating in the energy range from 300 to 1600 eV and intended for resonant inelastic X-ray scattering (RIXS) and angle-resolved photoelectron spectroscopy (ARPES) are described. The photon source is an undulato...
Autores principales: | , , , , , , , , , , , , , |
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Formato: | Texto |
Lenguaje: | English |
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International Union of Crystallography
2010
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2927903/ https://www.ncbi.nlm.nih.gov/pubmed/20724785 http://dx.doi.org/10.1107/S0909049510019862 |
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author | Strocov, V. N. Schmitt, T. Flechsig, U. Schmidt, T. Imhof, A. Chen, Q. Raabe, J. Betemps, R. Zimoch, D. Krempasky, J. Wang, X. Grioni, M. Piazzalunga, A. Patthey, L. |
author_facet | Strocov, V. N. Schmitt, T. Flechsig, U. Schmidt, T. Imhof, A. Chen, Q. Raabe, J. Betemps, R. Zimoch, D. Krempasky, J. Wang, X. Grioni, M. Piazzalunga, A. Patthey, L. |
author_sort | Strocov, V. N. |
collection | PubMed |
description | The concepts and technical realisation of the high-resolution soft X-ray beamline ADRESS operating in the energy range from 300 to 1600 eV and intended for resonant inelastic X-ray scattering (RIXS) and angle-resolved photoelectron spectroscopy (ARPES) are described. The photon source is an undulator of novel fixed-gap design where longitudinal movement of permanent magnetic arrays controls not only the light polarization (including circular and 0–180° rotatable linear polarizations) but also the energy without changing the gap. The beamline optics is based on the well established scheme of plane-grating monochromator operating in collimated light. The ultimate resolving power E/ΔE is above 33000 at 1 keV photon energy. The choice of blazed versus lamellar gratings and optimization of their profile parameters is described. Owing to glancing angles on the mirrors as well as optimized groove densities and profiles of the gratings, the beamline is capable of delivering high photon flux up to 1 × 10(13) photons s(−1) (0.01% BW)(−1) at 1 keV. Ellipsoidal refocusing optics used for the RIXS endstation demagnifies the vertical spot size down to 4 µm, which allows slitless operation and thus maximal transmission of the high-resolution RIXS spectrometer delivering E/ΔE > 11000 at 1 keV photon energy. Apart from the beamline optics, an overview of the control system is given, the diagnostics and software tools are described, and strategies used for the optical alignment are discussed. An introduction to the concepts and instrumental realisation of the ARPES and RIXS endstations is given. |
format | Text |
id | pubmed-2927903 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2010 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-29279032010-09-02 High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies Strocov, V. N. Schmitt, T. Flechsig, U. Schmidt, T. Imhof, A. Chen, Q. Raabe, J. Betemps, R. Zimoch, D. Krempasky, J. Wang, X. Grioni, M. Piazzalunga, A. Patthey, L. J Synchrotron Radiat Research Papers The concepts and technical realisation of the high-resolution soft X-ray beamline ADRESS operating in the energy range from 300 to 1600 eV and intended for resonant inelastic X-ray scattering (RIXS) and angle-resolved photoelectron spectroscopy (ARPES) are described. The photon source is an undulator of novel fixed-gap design where longitudinal movement of permanent magnetic arrays controls not only the light polarization (including circular and 0–180° rotatable linear polarizations) but also the energy without changing the gap. The beamline optics is based on the well established scheme of plane-grating monochromator operating in collimated light. The ultimate resolving power E/ΔE is above 33000 at 1 keV photon energy. The choice of blazed versus lamellar gratings and optimization of their profile parameters is described. Owing to glancing angles on the mirrors as well as optimized groove densities and profiles of the gratings, the beamline is capable of delivering high photon flux up to 1 × 10(13) photons s(−1) (0.01% BW)(−1) at 1 keV. Ellipsoidal refocusing optics used for the RIXS endstation demagnifies the vertical spot size down to 4 µm, which allows slitless operation and thus maximal transmission of the high-resolution RIXS spectrometer delivering E/ΔE > 11000 at 1 keV photon energy. Apart from the beamline optics, an overview of the control system is given, the diagnostics and software tools are described, and strategies used for the optical alignment are discussed. An introduction to the concepts and instrumental realisation of the ARPES and RIXS endstations is given. International Union of Crystallography 2010-09-01 2010-07-10 /pmc/articles/PMC2927903/ /pubmed/20724785 http://dx.doi.org/10.1107/S0909049510019862 Text en © V. N. Strocov et al. 2010 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. |
spellingShingle | Research Papers Strocov, V. N. Schmitt, T. Flechsig, U. Schmidt, T. Imhof, A. Chen, Q. Raabe, J. Betemps, R. Zimoch, D. Krempasky, J. Wang, X. Grioni, M. Piazzalunga, A. Patthey, L. High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies |
title | High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies |
title_full | High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies |
title_fullStr | High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies |
title_full_unstemmed | High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies |
title_short | High-resolution soft X-ray beamline ADRESS at the Swiss Light Source for resonant inelastic X-ray scattering and angle-resolved photoelectron spectroscopies |
title_sort | high-resolution soft x-ray beamline adress at the swiss light source for resonant inelastic x-ray scattering and angle-resolved photoelectron spectroscopies |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2927903/ https://www.ncbi.nlm.nih.gov/pubmed/20724785 http://dx.doi.org/10.1107/S0909049510019862 |
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