Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector

The advantages of backthinning monolithic active pixel sensors (MAPS) based on complementary metal oxide semiconductor (CMOS) direct electron detectors for electron microscopy have been discussed previously; they include better spatial resolution (modulation transfer function or MTF) and efficiency...

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Detalles Bibliográficos
Autores principales: McMullan, G., Faruqi, A.R., Henderson, R., Guerrini, N., Turchetta, R., Jacobs, A., van Hoften, G.
Formato: Texto
Lenguaje:English
Publicado: Elsevier 2009
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2937214/
https://www.ncbi.nlm.nih.gov/pubmed/19541421
http://dx.doi.org/10.1016/j.ultramic.2009.05.005

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2937214/
https://www.ncbi.nlm.nih.gov/pubmed/19541421
http://dx.doi.org/10.1016/j.ultramic.2009.05.005

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