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Experimental observation of the improvement in MTF from backthinning a CMOS direct electron detector
The advantages of backthinning monolithic active pixel sensors (MAPS) based on complementary metal oxide semiconductor (CMOS) direct electron detectors for electron microscopy have been discussed previously; they include better spatial resolution (modulation transfer function or MTF) and efficiency...
Autores principales: | McMullan, G., Faruqi, A.R., Henderson, R., Guerrini, N., Turchetta, R., Jacobs, A., van Hoften, G. |
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Formato: | Texto |
Lenguaje: | English |
Publicado: |
Elsevier
2009
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2937214/ https://www.ncbi.nlm.nih.gov/pubmed/19541421 http://dx.doi.org/10.1016/j.ultramic.2009.05.005 |
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