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Scanning probe microscopy and related methods

Detalles Bibliográficos
Autor principal: Meyer, Ernst
Formato: Texto
Lenguaje:English
Publicado: Beilstein-Institut 2010
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3045922/
https://www.ncbi.nlm.nih.gov/pubmed/21977405
http://dx.doi.org/10.3762/bjnano.1.18
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author Meyer, Ernst
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author_sort Meyer, Ernst
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spelling pubmed-30459222011-10-05 Scanning probe microscopy and related methods Meyer, Ernst Beilstein J Nanotechnol Editorial Beilstein-Institut 2010-12-22 /pmc/articles/PMC3045922/ /pubmed/21977405 http://dx.doi.org/10.3762/bjnano.1.18 Text en Copyright © 2010, Meyer https://creativecommons.org/licenses/by/2.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)
spellingShingle Editorial
Meyer, Ernst
Scanning probe microscopy and related methods
title Scanning probe microscopy and related methods
title_full Scanning probe microscopy and related methods
title_fullStr Scanning probe microscopy and related methods
title_full_unstemmed Scanning probe microscopy and related methods
title_short Scanning probe microscopy and related methods
title_sort scanning probe microscopy and related methods
topic Editorial
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3045922/
https://www.ncbi.nlm.nih.gov/pubmed/21977405
http://dx.doi.org/10.3762/bjnano.1.18
work_keys_str_mv AT meyerernst scanningprobemicroscopyandrelatedmethods