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Model for measurement of water layer thickness under lipid bilayers by surface plasmon resonance

A multilayered-substrate model is proposed for surface plasmon resonance (SPR)-based measurement of the thickness of a water layer sandwiched between a lipid bilayer and an underlying support. To calculate sensitivity, a 473 nm-wavelength excitation source and a silver layer are used for the SPR sen...

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Detalles Bibliográficos
Autor principal: Watanabe, Koyo
Formato: Texto
Lenguaje:English
Publicado: Optical Society of America 2011
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3087569/
https://www.ncbi.nlm.nih.gov/pubmed/21559124
http://dx.doi.org/10.1364/BOE.2.001115
Descripción
Sumario:A multilayered-substrate model is proposed for surface plasmon resonance (SPR)-based measurement of the thickness of a water layer sandwiched between a lipid bilayer and an underlying support. To calculate sensitivity, a 473 nm-wavelength excitation source and a silver layer are used for the SPR sensor. It is theoretically shown that the multilayered substrate design achieves sufficient sensitivity for such measurements and that sensitivity is enhanced with a SiO(2) layer of appropriate thickness and a buffer solution of high refractive index.