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High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating

The fabrication and characterization of Fresnel zone plates (FZPs) for hard X-ray microscopy applications are reported. High-quality 500 nm- and 1 µm-thick Au FZPs with outermost zone widths down to 50 nm and 70 nm, respectively, and with diameters up to 600 µm were fabricated. The diffraction effic...

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Autores principales: Gorelick, Sergey, Vila-Comamala, Joan, Guzenko, Vitaliy A., Barrett, Ray, Salomé, Murielle, David, Christian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2011
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3133522/
https://www.ncbi.nlm.nih.gov/pubmed/21525653
http://dx.doi.org/10.1107/S0909049511002366
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author Gorelick, Sergey
Vila-Comamala, Joan
Guzenko, Vitaliy A.
Barrett, Ray
Salomé, Murielle
David, Christian
author_facet Gorelick, Sergey
Vila-Comamala, Joan
Guzenko, Vitaliy A.
Barrett, Ray
Salomé, Murielle
David, Christian
author_sort Gorelick, Sergey
collection PubMed
description The fabrication and characterization of Fresnel zone plates (FZPs) for hard X-ray microscopy applications are reported. High-quality 500 nm- and 1 µm-thick Au FZPs with outermost zone widths down to 50 nm and 70 nm, respectively, and with diameters up to 600 µm were fabricated. The diffraction efficiencies of the fabricated FZPs were measured for a wide range of X-ray energies (2.8–13.2 keV) showing excellent values up to 65–75% of the theoretical values, reflecting the good quality of the FZPs. Spatially resolved diffraction efficiency measurements indicate the uniformity of the FZPs and a defect-free structure.
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spelling pubmed-31335222011-07-13 High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating Gorelick, Sergey Vila-Comamala, Joan Guzenko, Vitaliy A. Barrett, Ray Salomé, Murielle David, Christian J Synchrotron Radiat Research Papers The fabrication and characterization of Fresnel zone plates (FZPs) for hard X-ray microscopy applications are reported. High-quality 500 nm- and 1 µm-thick Au FZPs with outermost zone widths down to 50 nm and 70 nm, respectively, and with diameters up to 600 µm were fabricated. The diffraction efficiencies of the fabricated FZPs were measured for a wide range of X-ray energies (2.8–13.2 keV) showing excellent values up to 65–75% of the theoretical values, reflecting the good quality of the FZPs. Spatially resolved diffraction efficiency measurements indicate the uniformity of the FZPs and a defect-free structure. International Union of Crystallography 2011-05-01 2011-03-10 /pmc/articles/PMC3133522/ /pubmed/21525653 http://dx.doi.org/10.1107/S0909049511002366 Text en © Sergey Gorelick et al. 2011 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Gorelick, Sergey
Vila-Comamala, Joan
Guzenko, Vitaliy A.
Barrett, Ray
Salomé, Murielle
David, Christian
High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating
title High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating
title_full High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating
title_fullStr High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating
title_full_unstemmed High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating
title_short High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating
title_sort high-efficiency fresnel zone plates for hard x-rays by 100 kev e-beam lithography and electroplating
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3133522/
https://www.ncbi.nlm.nih.gov/pubmed/21525653
http://dx.doi.org/10.1107/S0909049511002366
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