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The role of the cantilever in Kelvin probe force microscopy measurements

The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the abso...

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Autores principales: Elias, George, Glatzel, Thilo, Meyer, Ernst, Schwarzman, Alex, Boag, Amir, Rosenwaks, Yossi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2011
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3148059/
https://www.ncbi.nlm.nih.gov/pubmed/21977437
http://dx.doi.org/10.3762/bjnano.2.29
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author Elias, George
Glatzel, Thilo
Meyer, Ernst
Schwarzman, Alex
Boag, Amir
Rosenwaks, Yossi
author_facet Elias, George
Glatzel, Thilo
Meyer, Ernst
Schwarzman, Alex
Boag, Amir
Rosenwaks, Yossi
author_sort Elias, George
collection PubMed
description The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the measured contact potential difference even under ultra-high vacuum conditions, and we demonstrate a good agreement between our model and KPFM measurements in ultra-high vacuum of NaCl monolayers grown on Cu(111). The effect of the oscillating cantilever shape on the KPFM resolution and sensitivity has been calculated and found to be relatively small.
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spelling pubmed-31480592011-10-05 The role of the cantilever in Kelvin probe force microscopy measurements Elias, George Glatzel, Thilo Meyer, Ernst Schwarzman, Alex Boag, Amir Rosenwaks, Yossi Beilstein J Nanotechnol Full Research Paper The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the measured contact potential difference even under ultra-high vacuum conditions, and we demonstrate a good agreement between our model and KPFM measurements in ultra-high vacuum of NaCl monolayers grown on Cu(111). The effect of the oscillating cantilever shape on the KPFM resolution and sensitivity has been calculated and found to be relatively small. Beilstein-Institut 2011-05-18 /pmc/articles/PMC3148059/ /pubmed/21977437 http://dx.doi.org/10.3762/bjnano.2.29 Text en Copyright © 2011, Elias et al. https://creativecommons.org/licenses/by/2.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)
spellingShingle Full Research Paper
Elias, George
Glatzel, Thilo
Meyer, Ernst
Schwarzman, Alex
Boag, Amir
Rosenwaks, Yossi
The role of the cantilever in Kelvin probe force microscopy measurements
title The role of the cantilever in Kelvin probe force microscopy measurements
title_full The role of the cantilever in Kelvin probe force microscopy measurements
title_fullStr The role of the cantilever in Kelvin probe force microscopy measurements
title_full_unstemmed The role of the cantilever in Kelvin probe force microscopy measurements
title_short The role of the cantilever in Kelvin probe force microscopy measurements
title_sort role of the cantilever in kelvin probe force microscopy measurements
topic Full Research Paper
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3148059/
https://www.ncbi.nlm.nih.gov/pubmed/21977437
http://dx.doi.org/10.3762/bjnano.2.29
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