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The importance of testing deep brain stimulation lead impedances before final lead implantation

BACKGROUND: In the setting of a deep brain stimulation (DBS) lead with defective electrical circuitry, potential patient morbidity and additional surgery may be avoided if impedance testing of the brain lead is performed prior to final lead implantation. In the present report, detection of a short c...

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Autores principales: Nazzaro, Jules M., Lyons, Kelly E., Pahwa, Rajesh, Ridings, Larry W
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Medknow Publications Pvt Ltd 2011
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3205500/
https://www.ncbi.nlm.nih.gov/pubmed/22059126
http://dx.doi.org/10.4103/2152-7806.85473
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author Nazzaro, Jules M.
Lyons, Kelly E.
Pahwa, Rajesh
Ridings, Larry W
author_facet Nazzaro, Jules M.
Lyons, Kelly E.
Pahwa, Rajesh
Ridings, Larry W
author_sort Nazzaro, Jules M.
collection PubMed
description BACKGROUND: In the setting of a deep brain stimulation (DBS) lead with defective electrical circuitry, potential patient morbidity and additional surgery may be avoided if impedance testing of the brain lead is performed prior to final lead implantation. In the present report, detection of a short circuit upon lead placement and prior to lead anchoring was detected utilizing recently released DBS hardware and software (Medtronic, Minneapolis, MN). This report suggests that neurosurgeons need to be aware and consider the use of the newly available DBS testing equipment. METHODS: During the first DBS lead placement in a 69-year-old man with advanced idiopathic Parkinson's disease undergoing bilateral subthalamic nucleus DBS over staged procedures, test stimulation and lead impedance testing were accomplished prior to lead anchoring. An external neurostimulator (ENS) was affixed to an updated clinician programmer and connected to the DBS lead with a screening cable specific for the ENS and DBS. RESULTS: Impedance testing demonstrated a short circuit involving the 1 and 3 lead-electrode bipolar combination in a visually intact lead. The lead was replaced, repeat impedance testing and test stimulation were completed and the intact lead was secured. Subsequent DBS surgeries were completed uneventfully. The lead abnormality was verified by the manufacturer. CONCLUSIONS: This case highlights a new method to test DBS lead circuitry at the time of placement. The method may also be employed to directly test lead integrity when localizing a DBS system short or open circuit of unclear etiology. Our case suggests that the method is valuable and should be utilized.
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spelling pubmed-32055002011-11-06 The importance of testing deep brain stimulation lead impedances before final lead implantation Nazzaro, Jules M. Lyons, Kelly E. Pahwa, Rajesh Ridings, Larry W Surg Neurol Int Technical Note BACKGROUND: In the setting of a deep brain stimulation (DBS) lead with defective electrical circuitry, potential patient morbidity and additional surgery may be avoided if impedance testing of the brain lead is performed prior to final lead implantation. In the present report, detection of a short circuit upon lead placement and prior to lead anchoring was detected utilizing recently released DBS hardware and software (Medtronic, Minneapolis, MN). This report suggests that neurosurgeons need to be aware and consider the use of the newly available DBS testing equipment. METHODS: During the first DBS lead placement in a 69-year-old man with advanced idiopathic Parkinson's disease undergoing bilateral subthalamic nucleus DBS over staged procedures, test stimulation and lead impedance testing were accomplished prior to lead anchoring. An external neurostimulator (ENS) was affixed to an updated clinician programmer and connected to the DBS lead with a screening cable specific for the ENS and DBS. RESULTS: Impedance testing demonstrated a short circuit involving the 1 and 3 lead-electrode bipolar combination in a visually intact lead. The lead was replaced, repeat impedance testing and test stimulation were completed and the intact lead was secured. Subsequent DBS surgeries were completed uneventfully. The lead abnormality was verified by the manufacturer. CONCLUSIONS: This case highlights a new method to test DBS lead circuitry at the time of placement. The method may also be employed to directly test lead integrity when localizing a DBS system short or open circuit of unclear etiology. Our case suggests that the method is valuable and should be utilized. Medknow Publications Pvt Ltd 2011-09-27 /pmc/articles/PMC3205500/ /pubmed/22059126 http://dx.doi.org/10.4103/2152-7806.85473 Text en Copyright: © 2011 Nazzaro JM. http://creativecommons.org/licenses/by-nc-sa/3.0 This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
spellingShingle Technical Note
Nazzaro, Jules M.
Lyons, Kelly E.
Pahwa, Rajesh
Ridings, Larry W
The importance of testing deep brain stimulation lead impedances before final lead implantation
title The importance of testing deep brain stimulation lead impedances before final lead implantation
title_full The importance of testing deep brain stimulation lead impedances before final lead implantation
title_fullStr The importance of testing deep brain stimulation lead impedances before final lead implantation
title_full_unstemmed The importance of testing deep brain stimulation lead impedances before final lead implantation
title_short The importance of testing deep brain stimulation lead impedances before final lead implantation
title_sort importance of testing deep brain stimulation lead impedances before final lead implantation
topic Technical Note
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3205500/
https://www.ncbi.nlm.nih.gov/pubmed/22059126
http://dx.doi.org/10.4103/2152-7806.85473
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