Advanced materials nanocharacterization

This special issue of Nanoscale Research Letters contains scientific contributions presented at the Symposium D "Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors" of the E-MRS Fall Meeting 2010, which was held in Warsa...

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Detalles Bibliográficos
Autores principales: Giannazzo, Filippo, Eyben, Pierre, Baranowski, Jacek, Camassel, Jean, Lányi, Stefan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Editorial
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211151/
https://www.ncbi.nlm.nih.gov/pubmed/21711622
http://dx.doi.org/10.1186/1556-276X-6-107
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author Giannazzo, Filippo
Eyben, Pierre
Baranowski, Jacek
Camassel, Jean
Lányi, Stefan
author_facet Giannazzo, Filippo
Eyben, Pierre
Baranowski, Jacek
Camassel, Jean
Lányi, Stefan
author_sort Giannazzo, Filippo
collection PubMed
description This special issue of Nanoscale Research Letters contains scientific contributions presented at the Symposium D "Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors" of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13(th )to 17(th )September, 2010.
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spelling pubmed-32111512011-11-09 Advanced materials nanocharacterization Giannazzo, Filippo Eyben, Pierre Baranowski, Jacek Camassel, Jean Lányi, Stefan Nanoscale Res Lett Editorial This special issue of Nanoscale Research Letters contains scientific contributions presented at the Symposium D "Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Inorganic Semiconductors" of the E-MRS Fall Meeting 2010, which was held in Warsaw, Poland from 13(th )to 17(th )September, 2010. Springer 2011-01-31 /pmc/articles/PMC3211151/ /pubmed/21711622 http://dx.doi.org/10.1186/1556-276X-6-107 Text en Copyright ©2011 Giannazzo et al; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Editorial
Giannazzo, Filippo
Eyben, Pierre
Baranowski, Jacek
Camassel, Jean
Lányi, Stefan
Advanced materials nanocharacterization
title Advanced materials nanocharacterization
title_full Advanced materials nanocharacterization
title_fullStr Advanced materials nanocharacterization
title_full_unstemmed Advanced materials nanocharacterization
title_short Advanced materials nanocharacterization
title_sort advanced materials nanocharacterization
topic Editorial
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211151/
https://www.ncbi.nlm.nih.gov/pubmed/21711622
http://dx.doi.org/10.1186/1556-276X-6-107
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AT eybenpierre advancedmaterialsnanocharacterization
AT baranowskijacek advancedmaterialsnanocharacterization
AT camasseljean advancedmaterialsnanocharacterization
AT lanyistefan advancedmaterialsnanocharacterization

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