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Lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy

In this article, a scanning probe method based on nanoscale capacitance measurements was used to investigate the lateral homogeneity of the electron mean free path both in pristine and ion-irradiated graphene. The local variations in the electronic transport properties were explained taking into acc...

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Detalles Bibliográficos
Autores principales: Giannazzo, Filippo, Sonde, Sushant, Rimini, Emanuele, Raineri, Vito
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211153/
https://www.ncbi.nlm.nih.gov/pubmed/21711643
http://dx.doi.org/10.1186/1556-276X-6-109
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author Giannazzo, Filippo
Sonde, Sushant
Rimini, Emanuele
Raineri, Vito
author_facet Giannazzo, Filippo
Sonde, Sushant
Rimini, Emanuele
Raineri, Vito
author_sort Giannazzo, Filippo
collection PubMed
description In this article, a scanning probe method based on nanoscale capacitance measurements was used to investigate the lateral homogeneity of the electron mean free path both in pristine and ion-irradiated graphene. The local variations in the electronic transport properties were explained taking into account the scattering of electrons by charged impurities and point defects (vacancies). Electron mean free path is mainly limited by charged impurities in unirradiated graphene, whereas an important role is played by lattice vacancies after irradiation. The local density of the charged impurities and vacancies were determined for different irradiated ion fluences.
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spelling pubmed-32111532011-11-09 Lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy Giannazzo, Filippo Sonde, Sushant Rimini, Emanuele Raineri, Vito Nanoscale Res Lett Nano Review In this article, a scanning probe method based on nanoscale capacitance measurements was used to investigate the lateral homogeneity of the electron mean free path both in pristine and ion-irradiated graphene. The local variations in the electronic transport properties were explained taking into account the scattering of electrons by charged impurities and point defects (vacancies). Electron mean free path is mainly limited by charged impurities in unirradiated graphene, whereas an important role is played by lattice vacancies after irradiation. The local density of the charged impurities and vacancies were determined for different irradiated ion fluences. Springer 2011-01-31 /pmc/articles/PMC3211153/ /pubmed/21711643 http://dx.doi.org/10.1186/1556-276X-6-109 Text en Copyright ©2011 Giannazzo et al; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Nano Review
Giannazzo, Filippo
Sonde, Sushant
Rimini, Emanuele
Raineri, Vito
Lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy
title Lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy
title_full Lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy
title_fullStr Lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy
title_full_unstemmed Lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy
title_short Lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy
title_sort lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy
topic Nano Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211153/
https://www.ncbi.nlm.nih.gov/pubmed/21711643
http://dx.doi.org/10.1186/1556-276X-6-109
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