Conductive-probe atomic force microscopy characterization of silicon nanowire

The electrical conduction properties of lateral and vertical silicon nanowires (SiNWs) were investigated using a conductive-probe atomic force microscopy (AFM). Horizontal SiNWs, which were synthesized by the in-plane solid-liquid-solid technique, are randomly deployed into an undoped hydrogenated a...

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Detalles Bibliográficos
Autores principales: Alvarez, José, Ngo, Irène, Gueunier-Farret, Marie-Estelle, Kleider, Jean-Paul, Yu, Linwei, Cabarrocas, Pere Rocai, Perraud, Simon, Rouvière, Emmanuelle, Celle, Caroline, Mouchet, Céline, Simonato, Jean-Pierre
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211155/
https://www.ncbi.nlm.nih.gov/pubmed/21711623
http://dx.doi.org/10.1186/1556-276X-6-110

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211155/
https://www.ncbi.nlm.nih.gov/pubmed/21711623
http://dx.doi.org/10.1186/1556-276X-6-110

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