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Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films

The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu(3)Ti(4)O(12 )(CCTO) thin films deposited by MOCVD on IrO(2 )bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular featur...

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Detalles Bibliográficos
Autores principales: Fiorenza, Patrick, Lo Nigro, Raffaella, Raineri, Vito
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211163/
https://www.ncbi.nlm.nih.gov/pubmed/21711646
http://dx.doi.org/10.1186/1556-276X-6-118
Descripción
Sumario:The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu(3)Ti(4)O(12 )(CCTO) thin films deposited by MOCVD on IrO(2 )bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular features in terms of conductive and insulating regions. The microstructure and the dielectric properties of CCTO thin films have been studied and the evidence of internal barriers in CCTO thin films has been provided. The role of internal barriers and the possible explanation for the extrinsic origin of the giant dielectric response in CCTO has been evaluated.