Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films

The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu(3)Ti(4)O(12 )(CCTO) thin films deposited by MOCVD on IrO(2 )bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular featur...

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Autores principales: Fiorenza, Patrick, Lo Nigro, Raffaella, Raineri, Vito
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211163/
https://www.ncbi.nlm.nih.gov/pubmed/21711646
http://dx.doi.org/10.1186/1556-276X-6-118
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author Fiorenza, Patrick
Lo Nigro, Raffaella
Raineri, Vito
author_facet Fiorenza, Patrick
Lo Nigro, Raffaella
Raineri, Vito
author_sort Fiorenza, Patrick
collection PubMed
description The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu(3)Ti(4)O(12 )(CCTO) thin films deposited by MOCVD on IrO(2 )bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular features in terms of conductive and insulating regions. The microstructure and the dielectric properties of CCTO thin films have been studied and the evidence of internal barriers in CCTO thin films has been provided. The role of internal barriers and the possible explanation for the extrinsic origin of the giant dielectric response in CCTO has been evaluated.
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spelling pubmed-32111632011-11-09 Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films Fiorenza, Patrick Lo Nigro, Raffaella Raineri, Vito Nanoscale Res Lett Nano Express The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu(3)Ti(4)O(12 )(CCTO) thin films deposited by MOCVD on IrO(2 )bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular features in terms of conductive and insulating regions. The microstructure and the dielectric properties of CCTO thin films have been studied and the evidence of internal barriers in CCTO thin films has been provided. The role of internal barriers and the possible explanation for the extrinsic origin of the giant dielectric response in CCTO has been evaluated. Springer 2011-02-04 /pmc/articles/PMC3211163/ /pubmed/21711646 http://dx.doi.org/10.1186/1556-276X-6-118 Text en Copyright ©2011 Fiorenza et al; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Nano Express
Fiorenza, Patrick
Lo Nigro, Raffaella
Raineri, Vito
Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films
title Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films
title_full Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films
title_fullStr Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films
title_full_unstemmed Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films
title_short Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films
title_sort scanning probe microscopy on heterogeneous cacu(3)ti(4)o(12 )thin films
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211163/
https://www.ncbi.nlm.nih.gov/pubmed/21711646
http://dx.doi.org/10.1186/1556-276X-6-118
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