Scanning Probe Microscopy on heterogeneous CaCu(3)Ti(4)O(12 )thin films

The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu(3)Ti(4)O(12 )(CCTO) thin films deposited by MOCVD on IrO(2 )bottom electrode. In particular, both techniques have been employed to clarify the role of the inter- and sub-granular featur...

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Detalles Bibliográficos
Autores principales: Fiorenza, Patrick, Lo Nigro, Raffaella, Raineri, Vito
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211163/
https://www.ncbi.nlm.nih.gov/pubmed/21711646
http://dx.doi.org/10.1186/1556-276X-6-118

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211163/
https://www.ncbi.nlm.nih.gov/pubmed/21711646
http://dx.doi.org/10.1186/1556-276X-6-118

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