Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy

Using an atomic force microscope (AFM) at a controlled contact force, we report the electrical signal response of multi-walled carbon nanotubes (MWCNTs) disposed on a golden thin film. In this investigation, we highlight first the theoretical calculation of the contact resistance between two types o...

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Detalles Bibliográficos
Autores principales: Dominiczak, Maguy, Otubo, Larissa, Alamarguy, David, Houzé, Frédéric, Volz, Sebastian, Noël, Sophie, Bai, Jinbo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211423/
https://www.ncbi.nlm.nih.gov/pubmed/21711904
http://dx.doi.org/10.1186/1556-276X-6-335

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