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Reliable processing of graphene using metal etchmasks

Graphene exhibits exciting properties which make it an appealing candidate for use in electronic devices. Reliable processes for device fabrication are crucial prerequisites for this. We developed a large area of CVD synthesis and transfer of graphene films. With patterning of these graphene layers...

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Detalles Bibliográficos
Autores principales: Kumar, Shishir, Peltekis, Nikos, Lee, Kangho, Kim, Hye-Young, Duesberg, Georg Stefan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211484/
https://www.ncbi.nlm.nih.gov/pubmed/21711911
http://dx.doi.org/10.1186/1556-276X-6-390
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author Kumar, Shishir
Peltekis, Nikos
Lee, Kangho
Kim, Hye-Young
Duesberg, Georg Stefan
author_facet Kumar, Shishir
Peltekis, Nikos
Lee, Kangho
Kim, Hye-Young
Duesberg, Georg Stefan
author_sort Kumar, Shishir
collection PubMed
description Graphene exhibits exciting properties which make it an appealing candidate for use in electronic devices. Reliable processes for device fabrication are crucial prerequisites for this. We developed a large area of CVD synthesis and transfer of graphene films. With patterning of these graphene layers using standard photoresist masks, we are able to produce arrays of gated graphene devices with four point contacts. The etching and lift off process poses problems because of delamination and contamination due to polymer residues when using standard resists. We introduce a metal etch mask which minimises these problems. The high quality of graphene is shown by Raman and XPS spectroscopy as well as electrical measurements. The process is of high value for applications, as it improves the processability of graphene using high-throughput lithography and etching techniques.
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spelling pubmed-32114842011-11-09 Reliable processing of graphene using metal etchmasks Kumar, Shishir Peltekis, Nikos Lee, Kangho Kim, Hye-Young Duesberg, Georg Stefan Nanoscale Res Lett Nano Express Graphene exhibits exciting properties which make it an appealing candidate for use in electronic devices. Reliable processes for device fabrication are crucial prerequisites for this. We developed a large area of CVD synthesis and transfer of graphene films. With patterning of these graphene layers using standard photoresist masks, we are able to produce arrays of gated graphene devices with four point contacts. The etching and lift off process poses problems because of delamination and contamination due to polymer residues when using standard resists. We introduce a metal etch mask which minimises these problems. The high quality of graphene is shown by Raman and XPS spectroscopy as well as electrical measurements. The process is of high value for applications, as it improves the processability of graphene using high-throughput lithography and etching techniques. Springer 2011-05-18 /pmc/articles/PMC3211484/ /pubmed/21711911 http://dx.doi.org/10.1186/1556-276X-6-390 Text en Copyright ©2011 Kumar et al; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Nano Express
Kumar, Shishir
Peltekis, Nikos
Lee, Kangho
Kim, Hye-Young
Duesberg, Georg Stefan
Reliable processing of graphene using metal etchmasks
title Reliable processing of graphene using metal etchmasks
title_full Reliable processing of graphene using metal etchmasks
title_fullStr Reliable processing of graphene using metal etchmasks
title_full_unstemmed Reliable processing of graphene using metal etchmasks
title_short Reliable processing of graphene using metal etchmasks
title_sort reliable processing of graphene using metal etchmasks
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3211484/
https://www.ncbi.nlm.nih.gov/pubmed/21711911
http://dx.doi.org/10.1186/1556-276X-6-390
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