The current image of single SnO(2 )nanobelt nanodevice studied by conductive atomic force microscopy

A single SnO(2 )nanobelt was assembled on a pair of Au electrodes by electric-field assembly method. The electronic transport property of single SnO(2 )nanobelt was studied by conductive atomic force microscopy (C-AFM). Back-to-back Schottky barrier-type junctions were created between AFM tip/SnO(2...

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Detalles Bibliográficos
Autores principales: Wang, Shujie, Cheng, Gang, Cheng, Ke, Jiang, Xiaohong, Du, Zuliang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2011
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3212080/
https://www.ncbi.nlm.nih.gov/pubmed/21970459
http://dx.doi.org/10.1186/1556-276X-6-541
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author Wang, Shujie
Cheng, Gang
Cheng, Ke
Jiang, Xiaohong
Du, Zuliang
author_facet Wang, Shujie
Cheng, Gang
Cheng, Ke
Jiang, Xiaohong
Du, Zuliang
author_sort Wang, Shujie
collection PubMed
description A single SnO(2 )nanobelt was assembled on a pair of Au electrodes by electric-field assembly method. The electronic transport property of single SnO(2 )nanobelt was studied by conductive atomic force microscopy (C-AFM). Back-to-back Schottky barrier-type junctions were created between AFM tip/SnO(2 )nanobelt/Au electrode which can be concluded from the I-V curve. The current images of single SnO(2 )nanobelt nanodevices were also studied by C-AFM techniques, which showed stripes patterns on the nanobelt surface. The current images of the nanobelt devices correlate the microscopy with separate transport properties measurement together.
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spelling pubmed-32120802011-11-09 The current image of single SnO(2 )nanobelt nanodevice studied by conductive atomic force microscopy Wang, Shujie Cheng, Gang Cheng, Ke Jiang, Xiaohong Du, Zuliang Nanoscale Res Lett Nano Express A single SnO(2 )nanobelt was assembled on a pair of Au electrodes by electric-field assembly method. The electronic transport property of single SnO(2 )nanobelt was studied by conductive atomic force microscopy (C-AFM). Back-to-back Schottky barrier-type junctions were created between AFM tip/SnO(2 )nanobelt/Au electrode which can be concluded from the I-V curve. The current images of single SnO(2 )nanobelt nanodevices were also studied by C-AFM techniques, which showed stripes patterns on the nanobelt surface. The current images of the nanobelt devices correlate the microscopy with separate transport properties measurement together. Springer 2011-10-04 /pmc/articles/PMC3212080/ /pubmed/21970459 http://dx.doi.org/10.1186/1556-276X-6-541 Text en Copyright ©2011 Wang et al; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Nano Express
Wang, Shujie
Cheng, Gang
Cheng, Ke
Jiang, Xiaohong
Du, Zuliang
The current image of single SnO(2 )nanobelt nanodevice studied by conductive atomic force microscopy
title The current image of single SnO(2 )nanobelt nanodevice studied by conductive atomic force microscopy
title_full The current image of single SnO(2 )nanobelt nanodevice studied by conductive atomic force microscopy
title_fullStr The current image of single SnO(2 )nanobelt nanodevice studied by conductive atomic force microscopy
title_full_unstemmed The current image of single SnO(2 )nanobelt nanodevice studied by conductive atomic force microscopy
title_short The current image of single SnO(2 )nanobelt nanodevice studied by conductive atomic force microscopy
title_sort current image of single sno(2 )nanobelt nanodevice studied by conductive atomic force microscopy
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3212080/
https://www.ncbi.nlm.nih.gov/pubmed/21970459
http://dx.doi.org/10.1186/1556-276X-6-541
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